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"Fast reliability exploration for embedded processors via high-level fault ..."

Zheng Wang, Chao Chen, Anupam Chattopadhyay (2013)

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DOI: 10.1109/ISQED.2013.6523621

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Zheng Wang, Chao Chen, Anupam Chattopadhyay:
Fast reliability exploration for embedded processors via high-level fault injection. ISQED 2013: 265-272

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