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"A 40-nm resilient cache memory for dynamic variation tolerance with ..."

Yohei Nakata et al. (2014)

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DOI: 10.1109/ISQED.2014.6783301

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-11

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  dblp key:
  - conf/isqed/NakataKOJSTNNYFNKKY14
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Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto:
A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement. ISQED 2014: 16-23

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