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"Electrical characteristic and power consumption fluctuations of ..."

Chieh-Yang Chen, Wen-Tsung Huang, Yiming Li (2015)

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DOI: 10.1109/ISQED.2015.7085399

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-24

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Chieh-Yang Chen, Wen-Tsung Huang, Yiming Li:
Electrical characteristic and power consumption fluctuations of trapezoidal bulk FinFET devices and circuits induced by random line edge roughness. ISQED 2015: 61-64

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