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"Compact Modeling of NBTI Replicating AC Stress / Recovery from a ..."

Takumi Hosaka et al. (2019)

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DOI: 10.1109/IOLTS.2019.8854421

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi:
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. IOLTS 2019: 305-309

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