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"The hype, myths, and realities of testing 3D integrated circuits."

Ran Wang et al. (2016)

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DOI: 10.1145/2966986.2980097

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-09

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Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty:
The hype, myths, and realities of testing 3D integrated circuits. ICCAD 2016: 58

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