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"Static Noise Margin based Yield Modelling of 6T SRAM for Area and Minimum ..."

Nidhi Batra et al. (2016)

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DOI: 10.1145/2902961.2903005

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Nidhi Batra, Pawan Sehgal, Shashwat Kaushik, Mohammad S. Hashmi, Sudesh Bhalla, Anuj Grover:
Static Noise Margin based Yield Modelling of 6T SRAM for Area and Minimum Operating Voltage Improvement using Recovery Techniques. ACM Great Lakes Symposium on VLSI 2016: 117-120

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