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"High-Temperature Characterization of Novel Silicon-Based Substrate ..."

Quentin Courte et al. (2021)

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DOI: 10.1109/ESSDERC53440.2021.9631831

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Quentin Courte, Martin Rack, M. Nabet, Pieter Cardinael, Jean-Pierre Raskin:
High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications. ESSDERC 2021: 187-190

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