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"Learning to Infer Voltage Stability Margin Using Transfer Learning."

Jiaming Li et al. (2019)

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DOI: 10.1109/DSW.2019.8755558

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-25

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  dblp key:
  - conf/dsw/LiZLK19
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Jiaming Li, Yue Zhao, Young-Hwan Lee, Seung-Jun Kim:
Learning to Infer Voltage Stability Margin Using Transfer Learning. DSW 2019: 270-274

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