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"Breakdown Voltage Shift of CMOS Buried Quad Junction (BQJ) Detector."

Thais Luana Vidal de Negreiros da Silva, Guo-Neng Lu, Patrick Pittet (2018)

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DOI: 10.1109/DCIS.2018.8681493

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Thais Luana Vidal de Negreiros da Silva, Guo-Neng Lu, Patrick Pittet:
Breakdown Voltage Shift of CMOS Buried Quad Junction (BQJ) Detector. DCIS 2018: 1-6

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