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"CMOS Mixed-Signal Circuit Process Variation Sensitivity Characterization ..."

Daeik D. Kim et al. (2006)

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DOI: 10.1109/CICC.2006.320950

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  - conf/cicc/KimCKPTA06
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Daeik D. Kim, Choongyeun Cho, Jonghae Kim, Jean-Olivier Plouchart, Robert Trzcinski, David Ahlgren:
CMOS Mixed-Signal Circuit Process Variation Sensitivity Characterization for Yield Improvement. CICC 2006: 365-368

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