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"A BIST Structure to Test Delay Faults in a Scan Environment."

Patrick Girard et al. (1998)

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DOI: 10.1109/ATS.1998.741653

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/GirardLMPV98
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  persistent URL:
  - https://dblp.org/rec/conf/ats/GirardLMPV98
Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel:
A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439

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