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"Test circuits for substrate noise evaluation in CMOS digital ICs."

Makoto Nagata et al. (2001)

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DOI: 10.1145/370155.370209

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Makoto Nagata, Takafumi Ohmoto, Jin Nagai, Takashi Morie, Atsushi Iwata:
Test circuits for substrate noise evaluation in CMOS digital ICs. ASP-DAC 2001: 13-14

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