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"A self-driven test structure for pseudorandom testing of non-scan ..."

Fidel Muradali, Janusz Rajski (1996)

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DOI: 10.1109/VTEST.1996.510830

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/MuradaliR96
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  persistent URL:
  - https://dblp.org/rec/conf/vts/MuradaliR96
Fidel Muradali, Janusz Rajski:
A self-driven test structure for pseudorandom testing of non-scan sequential circuits. VTS 1996: 17-25

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