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"A new test pattern generation method for delay fault testing."

S. Cremoux et al. (1996)

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DOI: 10.1109/VTEST.1996.510871

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/CremouxFGLP96
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  persistent URL:
  - https://dblp.org/rec/conf/vts/CremouxFGLP96
S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch:
A new test pattern generation method for delay fault testing. VTS 1996: 296-301

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