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Bartosz Swiderski
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2020 – today
- 2024
- [j11]Michal Bukowski, Jaroslaw Kurek, Bartosz Swiderski, Albina Jegorowa:
Custom Loss Functions in XGBoost Algorithm for Enhanced Critical Error Mitigation in Drill-Wear Analysis of Melamine-Faced Chipboard. Sensors 24(4): 1092 (2024) - 2023
- [c8]Bartosz Swiderski, Stanislaw Osowski, Jaroslaw Kurek, Cezary Chudobinski:
Random Ensemble of Extended CNN Structures for Medical Image Recognition. IWANN (1) 2023: 483-493 - 2022
- [j10]Bartosz Swiderski, Stanislaw Osowski, Grzegorz Gwardys, Jaroslaw Kurek, Monika Slowinska, Iwona Lugowska:
Random CNN structure: tool to increase generalization ability in deep learning. EURASIP J. Image Video Process. 2022(1): 3 (2022) - 2021
- [j9]Bartosz Swiderski, Lukasz Gielata, Pawel Olszewski, Stanislaw Osowski, Marcin Kolodziej:
Deep neural system for supporting tumor recognition of mammograms using modified GAN. Expert Syst. Appl. 164: 113968 (2021) - [c7]Bartosz Swiderski, Stanislaw Osowski, Pawel Olszewski, Lukasz Gielata, Monika Slowinska, Iwona Lugowska:
Random Deep Neural Network for Melanoma Recognition. IJCNN 2021: 1-7 - 2020
- [j8]Jaroslaw Kurek, Izabella Antoniuk, Bartosz Swiderski, Albina Jegorowa, Michal Bukowski:
Application of Siamese Networks to the Recognition of the Drill Wear State Based on Images of Drilled Holes. Sensors 20(23): 6978 (2020)
2010 – 2019
- 2018
- [j7]Sami Dhahbi, Walid Barhoumi, Jaroslaw Kurek, Bartosz Swiderski, Michal Kruk, Ezzeddine Zagrouba:
False-positive reduction in computer-aided mass detection using mammographic texture analysis and classification. Comput. Methods Programs Biomed. 160: 75-83 (2018) - [c6]Bartosz Swiderski, Michal Kruk, Grzegorz Wieczorek, Jaroslaw Kurek, Katarzyna Smietanska, Leszek J. Chmielewski, Jaroslaw Górski, Arkadiusz Orlowski:
Feature Selection for 'Orange Skin' Type Surface Defect in Furniture Elements. ICAISC (2) 2018: 81-91 - 2017
- [j6]Bartosz Swiderski, Stanislaw Osowski, Jaroslaw Kurek, Michal Kruk, Iwona Lugowska, Piotr Rutkowski, Walid Barhoumi:
Novel methods of image description and ensemble of classifiers in application to mammogram analysis. Expert Syst. Appl. 81: 67-78 (2017) - [c5]Michal Kruk, Bartosz Swiderski, Katarzyna Smietanska, Jaroslaw Kurek, Leszek J. Chmielewski, Jaroslaw Górski, Arkadiusz Orlowski:
Detection of 'Orange Skin' Type Surface Defects in Furniture Elements with the Use of Textural Features. CISIM 2017: 402-411 - 2016
- [j5]Bartosz Swiderski, Stanislaw Osowski, Michal Kruk, Walid Barhoumi:
Aggregation of classifiers ensemble using local discriminatory power and quantiles. Expert Syst. Appl. 46: 316-323 (2016) - 2015
- [j4]Michal Kruk, Bartosz Swiderski, Stanislaw Osowski, Jaroslaw Kurek, Monika Slowinska, Irena Walecka:
Melanoma recognition using extended set of descriptors and classifiers. EURASIP J. Image Video Process. 2015: 43 (2015) - [j3]Bartosz Swiderski, Stanislaw Osowski, Michal Kruk, Jaroslaw Kurek:
Texture characterization based on the Kolmogorov-Smirnov distance. Expert Syst. Appl. 42(1): 503-509 (2015) - 2013
- [p1]Krzysztof Siwek, Stanislaw Osowski, Bartosz Swiderski:
Study of Dynamics of Atmospheric Pollution and Its Association with Environmental Parameters. Selected Topics in Nonlinear Dynamics and Theoretical Electrical Engineering 2013: 179-190 - 2012
- [j2]Bartosz Swiderski, Jaroslaw Kurek, Stanislaw Osowski:
Multistage classification by using logistic regression and neural networks for assessment of financial condition of company. Decis. Support Syst. 52(2): 539-547 (2012) - 2010
- [c4]Krzysztof Siwek, Stanislaw Osowski, Bartosz Swiderski, Lukasz Mycka:
Prediction of Power Consumption for Small Power Region Using Indexing Approach and Neural Network. ICANN (1) 2010: 54-59
2000 – 2009
- 2009
- [j1]Bartosz Swiderski, Stanislaw Osowski, Andrzej Cichocki, Andrzej Rysz:
Single-class SVM and directed transfer function approach to the localization of the region containing epileptic focus. Neurocomputing 72(7-9): 1575-1583 (2009) - 2008
- [c3]Bartosz Swiderski, Stanislaw Osowski, Andrzej Cichocki, Andrzej Rysz:
Single-class SVM classifier for localization of epileptic focus on the basis of EEG. IJCNN 2008: 189-194 - 2007
- [c2]Bartosz Swiderski, Stanislaw Osowski, Andrzej Cichocki, Andrzej Rysz:
Epileptic Seizure Prediction Using Lyapunov Exponents and Support Vector Machine. ICANNGA (2) 2007: 373-381 - 2005
- [c1]Bartosz Swiderski, Stanislaw Osowski, Andrzej Rysz:
Lyapunov exponent of EEG signal for epileptic seizure characterization. ECCTD 2005: 153-156
Coauthor Index
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