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Alessandro S. Spinelli
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2020 – today
- 2024
- [c14]M. Greatti, J. L. Mazzola, C. Monzio Compagnoni, Alessandro S. Spinelli, D. Paci, F. Speroni, V. Marano, M. Lauria, Gerardo Malavena
:
Investigation of the Moisture- Driven Dynamics of Time- Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolators. IRPS 2024: 1-7 - 2023
- [c13]J. L. Mazzola, M. Greatti, C. Monzio Compagnoni, Alessandro S. Spinelli, V. Marano, M. Lauria, D. Paci, F. Speroni, Gerardo Malavena:
Modeling the Temperature Dependence of TDDB in Galvanic Isolators Based on Polymeric Dielectrics. ESSDERC 2023: 1-4 - [c12]Mattia Giulianini, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni:
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention. IRPS 2023: 1-6
2010 – 2019
- 2019
- [c11]Gerardo Malavena
Impact of Program Accuracy and Random Telegraph Noise on the Performance of a NOR Flash-based Neuromorphic Classifier. ESSDERC 2019: 122-125 - [c10]Aurelio Mannara, Alessandro S. Spinelli, Andrea L. Lacaita
Current Transport in Polysilicon-channel GAA MOSFETs: A Modeling Perspective. ESSDERC 2019: 222-225 - 2018
- [j5]Giacomo Pedretti
Stochastic Learning in Neuromorphic Hardware via Spike Timing Dependent Plasticity With RRAM Synapses. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(1): 77-85 (2018) - [c9]Alessandro S. Spinelli, Christian Monzio Compagnoni, Andrea L. Lacaita
Random Dopant Fluctuation and Random Telegraph Noise in Nanowire and Macaroni MOSFETs. ESSDERC 2018: 230-233 - 2017
- [j4]Alessandro S. Spinelli, Christian Monzio Compagnoni
Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices. Comput. 6(2): 16 (2017) - [j3]Christian Monzio Compagnoni, Akira Goda, Alessandro S. Spinelli, Peter Feeley, Andrea L. Lacaita
Reviewing the Evolution of the NAND Flash Technology. Proc. IEEE 105(9): 1609-1633 (2017) - 2015
- [c8]Carmine Miccoli, Giovanni M. Paolucci, Christian Monzio Compagnoni, Alessandro S. Spinelli, Akira Goda:
Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays. IRPS 2015: 9 - 2014
- [c7]Halid Mulaosmanovic
Data regeneration and disturb immunity of T-RAM cells. ESSDERC 2014: 46-49 - [c6]Giovanni M. Paolucci, Massimo Ernesto Bertuccio, Christian Monzio Compagnoni, Silvia Beltrami, Alessandro S. Spinelli
Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern. ESSDERC 2014: 54-57 - 2013
- [c5]Marcello Calabrese, Carmine Miccoli, Christian Monzio Compagnoni, Luca Chiavarone, Silvia Beltrami, Andrea Parisi, Sebastiano Bartolone, Andrea L. Lacaita
Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. ICICDT 2013: 37-40 - 2010
- [c4]Andrea Bonfanti
A multi-channel low-power IC for neural spike recording with data compression and narrowband 400-MHz MC-FSK wireless transmission. ESSCIRC 2010: 330-333
2000 – 2009
- 2009
- [c3]Andrea Bonfanti, Tommaso Borghi, Riccardo Gusmeroli, Guido Zambra, Alessandro S. Spinelli, Andriy Oliynyk, Luciano Fadiga, Gytis Baranauskas:
A Low-power Integrated Circuit for Analog Spike Detection and Sorting in Neural Prosthesis Systems. BIODEVICES 2009: 67-74 - 2007
- [c2]Tommaso Borghi, Andrea Bonfanti
An integrated low-noise multichannel system for neural signals amplification. ESSCIRC 2007: 456-459 - 2006
- [c1]Riccardo Gusmeroli, Andrea Bonfanti
A Switched-capacitor Neural Preamplifier with an Adjustable Pass-band for Fast Recovery following Stimulation. EMBC 2006: 652-655 - 2002
- [j2]E. Viganò, A. Ghetti
Post-breakdown characterization in thin gate oxides. Microelectron. Reliab. 42(9-11): 1491-1496 (2002) - 2001
- [j1]Raphael Clerc
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectron. Reliab. 41(7): 1027-1030 (2001)
Coauthor Index
aka: C. Monzio Compagnoni
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