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Diganta Das
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2020 – today
- 2024
- [j18]Dipanjali Kundu, Md. Mahbubur Rahman, Anichur Rahman, Diganta Das, Umme Raihan Siddiqi, Md. Golam Rabiul Alam
, Samrat Kumar Dey, Ghulam Muhammad
Federated Deep Learning for Monkeypox Disease Detection on GAN-Augmented Dataset. IEEE Access 12: 32819-32829 (2024) - [j17]Abhishek Ram, Diganta Das:
Enhancing qualification via the use of diagnostics and prognostics techniques. Qual. Reliab. Eng. Int. 40(8): 4352-4364 (2024) - [i1]Diganta Das, Dipanjali Kundu, Anichur Rahman, Muaz Rahman, Sadia Sazzad:
A Remote Control Painting System for Exterior Walls of High-Rise Buildings through Robotic System. CoRR abs/2409.05153 (2024) - 2023
- [j16]Omri Matania
One-fault-shot learning for fault severity estimation of gears that addresses differences between simulation and experimental signals and transfer function effects. Adv. Eng. Informatics 56: 101945 (2023) - 2021
- [j15]Aishwarya Gaonkar
An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics. IEEE Access 9: 10282-10290 (2021) - [j14]Xiangxiang Liu
Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors. IEEE Access 9: 95304-95316 (2021) - 2020
- [j13]Xiangxiang Liu
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access 8: 69471-69481 (2020)
2010 – 2019
- 2019
- [j12]Lidia Al-Zogbi
Breaking the Trust: How Companies Are Failing Their Customers. IEEE Access 7: 52522-52531 (2019) - [j11]Guanghua Wu
ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints. IEEE Access 7: 182906-182915 (2019) - [c4]Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood:
Evaluating Impact of Information Uncertainties on Component Reliability Assessment. IRPS 2019: 1-9 - 2018
- [j10]Nga Man Li, Subramani Manoharan
Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs). Microelectron. Reliab. 88-90: 528-533 (2018) - 2016
- [j9]Yi Wan, Hailong Huang, Diganta Das, Michael G. Pecht:
Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process. Microelectron. Reliab. 56: 182-188 (2016) - 2015
- [j8]Nishad Patil, Diganta Das, Michael G. Pecht
Anomaly detection for IGBTs using Mahalanobis distance. Microelectron. Reliab. 55(7): 1054-1059 (2015) - 2014
- [j7]Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht
Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test. IEEE Trans. Ind. Informatics 10(3): 1852-1863 (2014) - 2013
- [j6]Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht
Long term storage reliability of antifuse field programmable gate arrays. Microelectron. Reliab. 53(12): 2052-2056 (2013) - 2012
- [j5]Nishad Patil, Diganta Das, Michael G. Pecht
A prognostic approach for non-punch through and field stop IGBTs. Microelectron. Reliab. 52(3): 482-488 (2012) - [j4]Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht
Light emitting diodes reliability review. Microelectron. Reliab. 52(5): 762-782 (2012) - 2011
- [c3]Jun Dai, Diganta Das, Michael G. Pecht
Prognostics-based health management for telecom equipment under free air cooling. EUROCON 2011: 1-4 - [c2]Shunfeng Cheng, Diganta Das, Michael G. Pecht:
Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations. ICBO 2011 - 2010
- [c1]Nishad Patil, Diganta Das, Michael G. Pecht
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics. CE 2010: 643-651
2000 – 2009
- 2009
- [j3]Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht
Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics. IEEE Trans. Reliab. 58(2): 271-276 (2009) - 2002
- [j2]Michael G. Pecht, Diganta Das, Arun Ramakrishnan:
The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectron. Reliab. 42(9-11): 1259-1266 (2002)
1990 – 1999
- 1996
- [j1]Diganta Das, Satyandra K. Gupta, Dana S. Nau:
Generating redesign suggestions to reduce setup cost: a step towards automated redesign. Comput. Aided Des. 28(10): 763-782 (1996)
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