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Tao Chen 0006
Person information
- affiliation: Iowa State University, Department of Electrical and Computer Engineering, Ames, IA, USA
Other persons with the same name
- Tao Chen — disambiguation page
- Tao Chen 0001 — Loughborough University, Department of Computer Science, Leicestershire, UK (and 2 more)
- Tao Chen 0002 — Harbin Engineering University, College of Information and Communication Engineering, China
- Tao Chen 0003 — Fudan University, School of Information Science and Technology, Shanghai, China (and 2 more)
- Tao Chen 0004 — Southern University of Science and Technology, Department of Earth and Space Sciences, Shenzhen, China (and 3 more)
- Tao Chen 0005 — Beijing Institute of Radiation Medicine, Beijing Proteome Research Center, China
- Tao Chen 0007 — Beijing Institute of Remote Sensing Equipment, China
- Tao Chen 0008 — Google AI, Mountain View, CA, USA (and 2 more)
- Tao Chen 0009 — University of Surrey, Department of Chemical and Process Engineering, Guildford, UK (and 1 more)
- Tao Chen 0010 — Soochow University, Jiangsu Provincial Key Laboratory of Advanced Robotics, School of Mechanical and Electric Engineering, Suzhou, China
- Tao Chen 0011 — VTT Technical Research Centre of Finland Ltd., Espoo, Finland (and 1 more)
- Tao Chen 0012 — Nanjing University of Science and Technology, School of Computer Science and Engineering, China
- Tao Chen 0013 — National University of Defense Technology, Science and Technology on Information Systems Engineering Laboratory, Changsha, China (and 1 more)
- Tao Chen 0014 — Harbin Engineering University, College of Automation, Harbin, China
- Tao Chen 0015 — Columbia University, New York, NY, USA (and 1 more)
- Tao Chen 0016 — Southeast University, School of Electrical Engineering, Nanjing, China (and 3 more)
- Tao Chen 0017 — Hefei University of Technology, School of Computer and Information, Hefei, China
- Tao Chen 0018 — University of Essex, School of Computer Science and Electronic Engineering, Colchester, UK
- Tao Chen 0019 — Fudan University, School of Computer Science, Shanghai Key Laboratory of Data Science, Shanghai, China
- Tao Chen 0020 — Nanyang Technological University, Business School, Singapore
- Tao Chen 0021 — Chinese Academy of Sciences, Shanghai Institute of Technical Physics, Key Laboratory of Space Active Opto-Electronics Technology, Shanghai, China (and 2 more)
- Tao Chen 0022 — Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology, Research Center for Biomedical Optics and Molecular Imaging, Shenzhen, China
- Tao Chen 0023 — China University of Petroleum, School of Computer Science and Technology, Qingdao, China
- Tao Chen 0024 — Southwest Jiaotong University, Engineering Research Center of Advanced Driving Energy-saving Technology, Chengdu, China
- Tao Chen 0025 — South China University of Technology, School of Automation Science and Engineering, Guangzhou, China
- Tao Chen 0026 — Wuyi University, Faculty of Intelligent Manufacturing, Jiangmen, China (and 2 more)
- Tao Chen 0027 — Shanghai University of Engineering Science, School of Air Transportation, Shanghai, China
- Tao Chen 0028 — Lanzhou Jiaotong University, School of Automation and Electrical Engineering, Lanzhou, China
- Tao Chen 0029 — Chinese Academy of Sciences, Ningbo Institute of Materials Technology and Engineering, Zhejiang Key Laboratory of Marine Materials and Protective Technologies, Ningbo, China
- Tao Chen 0030 — University of Waterloo, Big Data Research Lab, Waterloo, Canada (and 1 more)
- Tao Chen 0031 — Communication University of China, School of Sciences, Department of Applied Mathematics, Beijing, China
- Tao Chen 0032 — Sun Yat-Sen University, School of Geography and Planning, Department of Physical Geography, Resources and Environment, Guangzhou, China
- Tao Chen 0033 — City University of Hong Kong,Department of Computer Science, Hong Kong
- Tao Chen 0034 — University of Florida, Department of Computer and Information Science and Engineering, Gainesville, FL, USA
- Tao Chen 0035 — China West Normal University, School of Computer Science, Nanchong, China
- Tao Chen 0036 — Southwest Jiaotong University, School of Electrical Engineering, Chengdu, China (and 1 more)
- Tao Chen 0037 — MediaTek Inc., Beijing, China (and 1 more)
- Tao Chen 0038 — Tsinghua University, Department of Engineering Physics, Institute of Public Safety Research, Beijing, China (and 1 more)
- Tao Chen 0039 — Lingnan Normal University, College of Mechanical and Electrical Engineering, Zhanjiang, China (and 1 more)
- Tao Chen 0040 — Central South University, College of Mechanical and Electrical Engineering, Changsha, China
- Tao Chen 0041 — Southern Medical University, Nanfang Hospital, Department of General Surgery, Guangzhou, China
- Tao Chen 0042 — University of Michigan, Department of Mathematics, Ann Arbor, MI, USA (and 1 more)
- Tao Chen 0043 — Oklahoma State University, Computer Science Department, Stillwater, OK, USA
- Tao Chen 0044 — Dolby Laboratories, Inc., Sunnyvale, CA, USA (and 4 more)
- Tao Chen 0045 — Cornell University, Ithaca, NY, USA
- Tao Chen 0046 — Massachusetts Institute of Technology, CSAIL, Cambridge , MA, USA (and 1 more)
- Tao Chen 0047 — PLA Information Engineering University (Zhengzhou Institute of Information Science and Technology), Department of Microelectronics, Zhengzhou, China
- Tao Chen 0048 — Nanjing Audit University, China (and 1 more)
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2020 – today
- 2020
- [j6]Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez:
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. 67-I(11): 3618-3629 (2020) - [j5]Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen:
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69(3): 729-738 (2020) - [j4]Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen:
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69(6): 3516-3526 (2020)
2010 – 2019
- 2019
- [c8]Tao Chen, Degang Chen:
Built-in self-test and self-calibration for analog and mixed signal circuits. ITC 2019: 1-8 - 2018
- [j3]Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen:
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(7): 2059-2069 (2018) - [j2]Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen:
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing. IEEE Trans. Instrum. Meas. 67(2): 279-287 (2018) - [c7]Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen:
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). I2MTC 2018: 1-6 - 2017
- [j1]Yan Duan, Tao Chen, Degang Chen:
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. J. Electron. Test. 33(6): 709-720 (2017) - [c6]Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen:
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC 2017: 1-10 - 2016
- [c5]Yan Duan, Tao Chen, Degang Chen:
Low-cost dithering generator for accurate ADC linearity test. ISCAS 2016: 1474-1477 - [c4]Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS 2016: 1-6 - 2015
- [c3]Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen:
High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. ISCAS 2015: 3016-3019 - [c2]Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS 2015: 1-4 - [c1]Tao Chen, Degang Chen:
Ultrafast stimulus error removal algorithm for ADC linearity test. VTS 2015: 1-5
Coauthor Index
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