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Sarvesh Bhardwaj
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2020 – today
- 2020
- [j10]Ankur Sharma
, David G. Chinnery
Fast Lagrangian Relaxation-Based Multithreaded Gate Sizing Using Simple Timing Calibrations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(7): 1456-1469 (2020)
2010 – 2019
- 2015
- [c20]Ankur Sharma, David G. Chinnery
Fast Lagrangian Relaxation Based Gate Sizing using Multi-Threading. ICCAD 2015: 426-433 - 2014
- [c19]Pei-Ci Wu, Martin D. F. Wong
On Timing Closure: Buffer Insertion for Hold-Violation Removal. DAC 2014: 6:1-6:6 - 2010
- [j9]Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Frank Liu, Yu Cao
The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 173-183 (2010) - [j8]Aviral Shrivastava
Reducing Functional Unit Power Consumption and its Variation Using Leakage Sensors. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 988-997 (2010)
2000 – 2009
- 2009
- [j7]Satyajayant Misra, Guoliang Xue, Sarvesh Bhardwaj:
Secure and Robust Localization in a Wireless Ad Hoc Environment. IEEE Trans. Veh. Technol. 58(3): 1480-1489 (2009) - 2008
- [j6]Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao, Sarma B. K. Vrudhula:
Scalable model for predicting the effect of negative bias temperature instability for reliable design. IET Circuits Devices Syst. 2(4): 361-371 (2008) - [j5]Sarvesh Bhardwaj, Sarma B. K. Vrudhula:
Multi-Attribute Optimization with Application to Leakage-Delay Trade-Offs Using Utility Theory. J. Low Power Electron. 4(1): 68-80 (2008) - [j4]Sarvesh Bhardwaj, Sarma B. K. Vrudhula:
Leakage Minimization of Digital Circuits Using Gate Sizing in the Presence of Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(3): 445-455 (2008) - [j3]Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Amit Goel:
A Unified Approach for Full Chip Statistical Timing and Leakage Analysis of Nanoscale Circuits Considering Intradie Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(10): 1812-1825 (2008) - [c18]Deepa Kannan, Aviral Shrivastava
Temperature and Process Variations Aware Power Gating of Functional Units. VLSI Design 2008: 515-520 - [c17]Deepa Kannan, Aviral Shrivastava
Power Reduction of Functional Units Considering Temperature and Process Variations. VLSI Design 2008: 533-539 - 2007
- [c16]Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Rakesh Vattikonda, Sarma B. K. Vrudhula, Frank Liu, Yu Cao:
The Impact of NBTI on the Performance of Combinational and Sequential Circuits. DAC 2007: 364-369 - [c15]Amit Goel, Sarvesh Bhardwaj, Praveen Ghanta, Sarma B. K. Vrudhula:
Computation of Joint Timing Yield of Sequential Networks Considering Process Variations. PATMOS 2007: 125-137 - [c14]Sarma B. K. Vrudhula, Sarvesh Bhardwaj:
Tutorial T6: Robust Design of Nanoscale Circuits in the Presence of Process Variations. VLSI Design 2007: 9 - [c13]Sarvesh Bhardwaj, Sarma B. K. Vrudhula:
A Fast and Accurate approach for Full Chip Leakage Analysis of Nano-scale circuits considering Intra-die Correlations. VLSI Design 2007: 589-594 - 2006
- [j2]Sarvesh Bhardwaj, Yu Cao, Sarma B. K. Vrudhula:
Statistical Leakage Minimization of Digital Circuits Using Gate Sizing, Gate Length Biasing, Threshold Voltage Selection. J. Low Power Electron. 2(2): 240-250 (2006) - [c12]Sarvesh Bhardwaj, Yu Cao, Sarma B. K. Vrudhula:
Statistical leakage minimization through joint selection of gate sizes, gate lengths and threshold voltage. ASP-DAC 2006: 953-958 - [c11]Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao, Sarma B. K. Vrudhula:
Predictive Modeling of the NBTI Effect for Reliable Design. CICC 2006: 189-192 - [c10]Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhardwaj, Rajendran Panda:
Stochastic variational analysis of large power grids considering intra-die correlations. DAC 2006: 211-216 - [c9]Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Praveen Ghanta, Yu Cao:
Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits. DAC 2006: 791-796 - [c8]Sarvesh Bhardwaj, Praveen Ghanta, Sarma B. K. Vrudhula:
A framework for statistical timing analysis using non-linear delay and slew models. ICCAD 2006: 225-230 - [c7]Sarvesh Bhardwaj, Yu Cao, Sarma B. K. Vrudhula:
LOTUS: Leakage Optimization under Timing Uncertainty for Standard-cell designs. ISQED 2006: 717-722 - 2005
- [j1]Sarvesh Bhardwaj, Sarma B. K. Vrudhula, David T. Blaauw:
Probability distribution of signal arrival times using Bayesian networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(11): 1784-1794 (2005) - [c6]Vineet Agarwal, Navneeth Kankani, Ravishankar Rao, Sarvesh Bhardwaj, Janet Meiling Wang:
An efficient combinationality check technique for the synthesis of cyclic combinational circuits. ASP-DAC 2005: 212-215 - [c5]Sarvesh Bhardwaj, Sarma B. K. Vrudhula:
Leakage minimization of nano-scale circuits in the presence of systematic and random variations. DAC 2005: 541-546 - [c4]Sarvesh Bhardwaj, Sarma B. K. Vrudhula:
Formalizing designer's preferences for multiattribute optimization with application to leakage-delay tradeoffs. ICCAD 2005: 713-718 - 2004
- [c3]Kaviraj Chopra, Sarma B. K. Vrudhula, Sarvesh Bhardwaj:
Efficient Algorithms for Identifying the Minimum Leakage States in CMOS Combinational Logic. VLSI Design 2004: 240- - 2003
- [c2]Sarvesh Bhardwaj, Sarma B. K. Vrudhula, David T. Blaauw:
AU: Timing Analysis Under Uncertainty. ICCAD 2003: 615-620 - 2002
- [c1]Sarvesh Bhardwaj, Sarma B. K. Vrudhula, David T. Blaauw:
Estimation of signal arrival times in the presence of delay noise. ICCAD 2002: 418-422
Coauthor Index
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