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Srikanth Krishnan
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2020 – today
- 2024
- [c14]Hariram Mohanram, Harikrishnan Kumarasamy
, Choong-Un Kim, Young-Joon Park, Srikanth Krishnan:
Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current. IRPS 2024: 1-6 - 2022
- [c13]Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy:
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. IRPS 2022: 10 - 2021
- [c12]Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam:
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. IRPS 2021: 1-6 - 2020
- [c11]Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam:
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. IRPS 2020: 1-6 - [c10]Chung-Shuo Lee, Pavan Kumar Vaitheeswaran, Ganesh Subbarayan, Young-Joon Park, Jayhoon Chung, Srikanth Krishnan:
Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing. IRPS 2020: 1-6
2010 – 2019
- 2019
- [c9]Ethan S. Lee, Luis Hurtado, Jungwoo Joh, Srikanth Krishnan, Sameer Pendharkar, Jesús A. del Alamo:
Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs. IRPS 2019: 1-5 - [c8]Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy:
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. IRPS 2019: 1-6 - [c7]Young-Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan:
Current Crowding Impact on Electromigration in Al Interconnects. IRPS 2019: 1-6 - 2018
- [c6]SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam:
High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics. IRPS 2018: 9-1 - [c5]Nitish Nag
Cross-Modal Health State Estimation. ACM Multimedia 2018: 1993-2002 - [i1]Nitish Nag, Vaibhav Pandey, Preston J. Putzel, Hari Bhimaraju, Srikanth Krishnan, Ramesh C. Jain:
Cross-Modal Health State Estimation. CoRR abs/1808.06462 (2018) - 2013
- [c4]Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao
ACE: A robust variability and aging sensor for high-k/metal gate SoC. ESSDERC 2013: 182-185 - 2012
- [j2]Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors. IEEE Des. Test Comput. 29(5): 18-26 (2012)
2000 – 2009
- 2009
- [c3]Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao
Circuit aging prediction for low-power operation. CICC 2009: 427-430 - 2008
- [c2]Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao:
Statistical prediction of circuit aging under process variations. CICC 2008: 13-16 - 2007
- [c1]Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao:
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. CICC 2007: 511-514 - 2005
- [j1]Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan:
Impact of negative bias temperature instability on digital circuit reliability. Microelectron. Reliab. 45(1): 31-38 (2005)
Coauthor Index
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