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Libor Rufer
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2020 – today
- 2023
- [j7]Alessandro Nastro
, Marco Baù
Cell Alignment in Aqueous Solution Employing a Flexural Plate Wave Piezoelectric MEMS Transducer. IEEE Access 11: 130755-130762 (2023) - 2020
- [j6]Fares Tounsi
Performances Evaluation of On-Chip Large-Size-Tapped Transformer for MEMS Applications. IEEE Trans. Instrum. Meas. 69(9): 7051-7060 (2020)
2010 – 2019
- 2019
- [c11]Alasatri Suresh, Ko Lok Mak, Jad Benserhir, Joshua E.-Y. Lee, Libor Rufer
Air-coupled Ultrasonic Rangefinder with Meter-long Detection Range Based on a Dual-electrode PMUT Fabricated Using a Multi-user MEMS Process. IEEE SENSORS 2019: 1-4 - 2013
- [c10]J. Esteves, Libor Rufer
CMOS-MEMS technology with front-end surface etching of sacrificial SiO2 dedicated for acoustic devices. IWASI 2013: 154-159 - 2011
- [c9]Zhijian Zhou, Man Wong
Wide-band piezoresistive aero-acoustic microphone. VLSI-SoC 2011: 214-219 - 2010
- [j5]Fabio Cenni, Jeremie Cazalbou, Salvador Mir, Libor Rufer
Design of a SAW-based chemical sensor with its microelectronics front-end interface. Microelectron. J. 41(11): 723-732 (2010) - [c8]Gustavo Pamplona Rehder
Low Frequency Test for RF MEMS Switches. DELTA 2010: 350-354
2000 – 2009
- 2009
- [j4]Achraf Dhayni, Salvador Mir, Libor Rufer
Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectron. J. 40(7): 1054-1061 (2009) - 2008
- [j3]Emmanuel Simeu, Hoang Nam Nguyen, Philippe Cauvet, Salvador Mir, Libor Rufer
Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing. VLSI Design 2008: 294014:1-294014:10 (2008) - 2006
- [j2]Salvador Mir, Libor Rufer
Built-in-self-test techniques for MEMS. Microelectron. J. 37(12): 1591-1597 (2006) - [c7]Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur:
Pseudorandom functional BIST for linear and nonlinear MEMS. DATE 2006: 664-669 - 2005
- [j1]Libor Rufer
On-Chip Pseudorandom MEMS Testing. J. Electron. Test. 21(3): 233-241 (2005) - [c6]Achraf Dhayni, Salvador Mir, Libor Rufer
Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities. ETS 2005: 82-87 - [c5]Achraf Dhayni, Salvador Mir, Libor Rufer
On-chip Pseudorandom Testing for Linear and Nonlinear MEMS. VLSI-SoC 2005: 245-266 - 2004
- [c4]Achraf Dhayni, Salvador Mir, Libor Rufer
Mems built-in-self-test using MLS. ETS 2004: 66-71 - [c3]Salvador Mir, Benoît Charlot, Libor Rufer
On-chip testing of embedded silicon transducers. SoCC 2004: 13-18 - [c2]Salvador Mir, Libor Rufer
On-chip testing of embedded transducers. VLSI Design 2004: 463- - 2003
- [c1]Salvador Mir, Luís Rolíndez, Christian Domigues, Libor Rufer
An implementation of memory-based on-chip analogue test signal generation. ASP-DAC 2003: 663-668
Coauthor Index
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