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Marcelo Negreiros
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2010 – 2019
- 2017
- [c22]Fábio Irigon Pereira, Gustavo Ilha, Joel Luft, Marcelo Negreiros
, Altamiro Amadeu Susin:
Monocular Visual Odometry with Cyclic Estimation. SIBGRAPI 2017: 1-6 - 2014
- [c21]Fábio I. Pereira, André Borin Soarez, Altamiro Amadeu Susin, Alexsandro Cristovão Bonatto
H.264 8x8 inverse transform architecture optimization. ACM Great Lakes Symposium on VLSI 2014: 83-84 - [c20]Alexsandro Cristovão Bonatto
Adaptive Shared Memory Control for Multimedia Systems-on-Chip. SBCCI 2014: 46:1-46:7 - 2012
- [c19]Alexsandro Cristovão Bonatto
Towards an Efficient Memory Architecture for Video Decoding Systems. SBESC 2012: 198-203
2000 – 2009
- 2007
- [j8]Marcelo Negreiros
Reducing Test Time Using an Enhanced RF Loopback. J. Electron. Test. 23(6): 613-623 (2007) - [c18]Erik Schüler, Marcelo Negreiros
A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. ETS 2007: 21-28 - [c17]Marcelo Negreiros
Digital Generation of Signals for Low Cost RF BIST. ETS 2007: 49-54 - [c16]Marcelo Negreiros
RF Digital Signal Generation Beyond Nyquist. VTS 2007: 15-22 - [i1]Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
Noise Figure Evaluation Using Low Cost BIST. CoRR abs/0710.4718 (2007) - 2006
- [c15]Marcelo Negreiros
An improved RF loopback for test time reduction. DATE 2006: 646-651 - 2005
- [j7]Maria Da Gloria Flores, Marcelo Negreiros
Low Cost BIST for Static and Dynamic Testing of ADCs. J. Electron. Test. 21(3): 283-290 (2005) - [j6]Marcelo Negreiros
Low Cost On-Line Testing Strategy for RF Circuits. J. Electron. Test. 21(4): 417-427 (2005) - [c14]Marcelo Negreiros
Noise Figure Evaluation Using Low Cost BIST. DATE 2005: 158-163 - 2004
- [j5]Maria Da Gloria Flores, Marcelo Negreiros
INL and DNL estimation based on noise for ADC test. IEEE Trans. Instrum. Meas. 53(5): 1391-1395 (2004) - [c13]Marcelo Negreiros
Low Cost Analog Testing of RF Signal Paths. DATE 2004: 292-297 - [c12]Marcelo Negreiros
Towards a BIST technique for noise figure evaluation. ETS 2004: 122-126 - [c11]Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
Low Cost On-Line Testing of RF Circuits. IOLTS 2004: 73-78 - 2003
- [j4]Luigi Carro
Circuit-Level Considerations for Mixed-Signal Programmable Components. IEEE Des. Test Comput. 20(1): 76-84 (2003) - [j3]Marcelo Negreiros
A Statistical Sampler for a New On-Line Analog Test Method. J. Electron. Test. 19(5): 585-595 (2003) - [j2]Marcelo Negreiros
Testing analog circuits using spectral analysis. Microelectron. J. 34(10): 937-944 (2003) - [c10]Marcelo Negreiros
Ultimate low cost analog BIST. DAC 2003: 570-573 - [c9]Marcelo Negreiros
Testing RF Signal Paths Using Spectral Analysis and Subsampling. SBCCI 2003: 329- - [c8]Marcelo Negreiros
Ultra Low Cost Analog BIST Using Spectral Analysis. VTS 2003: 77-82 - 2002
- [c7]Marcelo Negreiros
A Statistical Sampler for a New On-line Analog Test Method. IOLTW 2002: 79- - [c6]Adão Antonio de Souza Junior, Marcelo Negreiros, Luigi Carro, Altamiro A. Suzim:
Complex Adaptive Signal Processing for Analog Testing. LATW 2002: 166-173 - [c5]André Borin Soares, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
Analysis and Implementation of a Stochastic Multiplier for Electrical Power Measurement. SBCCI 2002: 9-13 - [c4]M. G. C. Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
A Noise Generator for Analog-to-Digital Converter Testing. SBCCI 2002: 135-140 - [c3]Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
A Statistical Sampler for Increasing Analog Circuits Observability. SBCCI 2002: 141-148 - 2000
- [j1]Érika F. Cota, Marcelo Negreiros
A new adaptive analog test and diagnosis system. IEEE Trans. Instrum. Meas. 49(2): 223-227 (2000) - [c2]Luigi Carro, Adão Antônio de Souza Jr.
Non-Linear Components for Mixed Circuits Analog Front-End. DATE 2000: 544-549
1990 – 1999
- 1998
- [c1]Luigi Carro, Marcelo Negreiros
Efficient Analog Test Methodology Based on Adaptive Algorithms. DAC 1998: 32-37
Coauthor Index
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