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Sanae Seike

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2006
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Sanae Seike, Ken Namura, Yukio Ohya, Anis Uzzaman, Shinichi Arima, Dale Meehl, Vivek Chickermane, Azumi Kobayashi, Satoshi Tanaka, Hiroyuki Adachi:
Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis. ATS 2006: 415-420

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