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Kazuki Monta

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2020 – today

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2024
[c9]
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  - conf/cosade/HasegawaMWMN24
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Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata:
On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. COSADE 2024: 22-37
[c8]
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  - conf/emccompo/WadatsumiHMMLCN24
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Takuya Wadatsumi, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Lang Lin, Norman Chang, Makoto Nagata:
Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection. EMC Compo 2024: 1-4
[c7]
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  - conf/fdtc/HayashiHWMMN24
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Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata:
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips. FDTC 2024: 44-52
[c6]
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  - conf/host/LiLCCMNMNLSYJXJAT24
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Henian Li, Lang Lin, Norman Chang, Sreeja Chowdhury, Dylan Mcguire, Bozidar Novakovic, Kazuki Monta, Makoto Nagata, Ying-Shiun Li, Pramod M. S, Piin-Chen Yeh, Jyh-Shing Roger Jang, Chengjie Xi, Qiutong Jin, Navid Asadi, Mark M. Tehranipoor:
Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation. HOST 2024: 107-111
2023
[j2]
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  - journals/jetc/MontaLWSCCGCPCN23
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Kazuki Monta, Lang Lin, Jimin Wen, Harsh Shrivastav, Calvin Chow, Hua Chen, Joao Geada, Sreeja Chowdhury, Nitin Pundir, Norman Chang, Makoto Nagata:
Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis. ACM J. Emerg. Technol. Comput. Syst. 19(1): 9:1-9:23 (2023)
[c5]
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  - conf/dac/MontaNBV23
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Kazuki Monta, Makoto Nagata, Josep Balasch, Ingrid Verbauwhede:
On the Unpredictability of SPICE Simulations for Side-Channel Leakage Verification of Masked Cryptographic Circuits. DAC 2023: 1-6
[c4]
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  - conf/irps/WadatsumiKHMMN23
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Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Makoto Nagata:
Characterization of Backside ESD Impacts on Integrated Circuits. IRPS 2023: 1-6
2022
[j1]
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  - journals/dt/MontaKFMHNM22
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Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen:
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements. IEEE Des. Test 39(5): 79-87 (2022)
2021
[c3]
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  - conf/ets/MontaKFHNM21
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Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen:
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. ETS 2021: 1-4
[c2]
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  - conf/host/LinZWCLCCSCMN21
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Lang Lin, Deqi Zhu, Jimin Wen, Hua Chen, Yu Lu, Norman Chang, Calvin Chow, Harsh Shrivastav, Chia-Wei Chen, Kazuki Monta, Makoto Nagata:
Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification. HOST 2021: 270-280
2020
[c1]
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  - conf/ises/LinSZCCNM20
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Lang Lin, Dinesh Selvakumaran, Deqi Zhu, Norman Chang, Calvin Chow, Makoto Nagata, Kazuki Monta:
Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis. iSES 2020: 133-138

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