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Stephen Ramey
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2020 – today
- 2024
- [c14]Ricardo Ascázubi, Bahar Ajdari, Curtis Shirota, Stephen Ramey:
Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology. IRPS 2024: 1-6 - 2023
- [c13]M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey:
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. IRPS 2023: 1-5 - [c12]K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey:
A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. IRPS 2023: 1-6 - [c11]S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey:
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. IRPS 2023: 1-4 - 2022
- [c10]D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey:
Method to evaluate off-state breakdown in scaled Tri-gate technologies. IRPS 2022: 1-6 - 2020
- [c9]Rohit Grover, Tony Acosta, C. AnDyke, Emre Armagan, C. Auth, Sunny Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C.-Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, Pinakpani Nayak, Adam Neale, D. Nminibapiel, Benjamin Orr, James Palmer, C. M. Pelto, S. S. Poon, I. Post, Tanmoy Pramanik, Anisur Rahman, Stephen Ramey, Norbert Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh:
A Reliability Overview of Intel's 10+ Logic Technology. IRPS 2020: 1-6 - [c8]Inanc Meric, Stephen Ramey, Steven R. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks:
Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. IRPS 2020: 1-6 - [c7]Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li
, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young:
Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. IRPS 2020: 1-5 - [c6]Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks:
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. IRPS 2020: 1-5 - [c5]Peng Xiao, Haris Hadziosmanovic, Rong Jiang, Misagh Rostami-asrabad, Stephen Ramey, Ilan Tsamaret:
Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies. IRPS 2020: 1-4
2010 – 2019
- 2018
- [c4]Anisur Rahman, Javier Dacuña, Pinakpani Nayak, Gerald S. Leatherman, Stephen Ramey:
Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG. IRPS 2018: 6 - [c3]Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey:
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS 2018: 6 - 2015
- [c2]Steven R. Novak, C. Parker, D. Becher, M. Liu, Marty Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan:
Transistor aging and reliability in 14nm tri-gate technology. IRPS 2015: 2 - [c1]Stephen Ramey, M. Chahal, P. Nayak, Steven R. Novak, Chetan Prasad, Jeffery Hicks:
Transistor reliability variation correlation to threshold voltage. IRPS 2015: 3
Coauthor Index
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