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Mijung Noh
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2020 – today
- 2024
- [j1]Kwanyeob Chae
, Jaegeun Song, Yoonjae Choi
A 4-nm 1.15 TB/s HBM3 Interface With Resistor-Tuned Offset Calibration and In Situ Margin Detection. IEEE J. Solid State Circuits 59(1): 231-242 (2024) - 2023
- [c8]Kwanyeob Chae, Jiyeon Park, Jaegeun Song, Billy Koo, Jihun Oh, Shinyoung Yi, Won Lee, Dongha Kim, Taekyung Yeo, Kyeongkeun Kang, Sangsoo Park, Eunsu Kim, Sukhyun Jung, Sanghune Park, Sungcheol Park, Mijung Noh, Hyo-Gyuem Rhew, Jongshin Shin:
A 4nm 1.15TB/s HBM3 Interface with Resistor-Tuned Offset-Calibration and In-Situ Margin-Detection. ISSCC 2023: 406-407 - 2022
- [c7]Sangsoon Im, Giha Nam, Sungcheol Park, Mijung Noh:
Advanced safety test solution for automotive SoC based on In-System-Test architecture. ISCAS 2022: 2290-2293 - 2021
- [c6]Seungwon Lee, JuHyung Hong, Chulseung Lee, Sandeep Vallabhaneni, SoonGon Kim, Yong Jin Shin, Mijung Noh, Soon-jae Won, Soonbok Jang, Yong Ho Song:
High Performance Low Power Controller for Data Center SSDs. HCS 2021: 1-7 - [c5]Arijit Raychowdhury, Mijung Noh, Keith A. Bowman:
Session 35 Overview: Adaptive Digital Techniques for Variation Tolerant Systems Digital Circuits Subcommittee. ISSCC 2021: 488-489 - [c4]Christopher Gonzalez, Huichu Liu, Mijung Noh, Eric Karl, Thomas Toifl, Shawn S. H. Hsu
F5: Enabling New System Architectures with 2.5D, 3D, and Chiplets. ISSCC 2021: 529-532 - 2020
- [c3]Jian Ouyang, Mijung Noh, Yong Wang, Wei Qi, Yin Ma, Canghai Gu, SoonGon Kim, Ki-il Hong, Wang-Keun Bae, Zhibiao Zhao, Jing Wang, Peng Wu, Xiaozhang Gong, Jiaxin Shi, Hefei Zhu, Xueliang Du
Baidu Kunlun An AI processor for diversified workloads. Hot Chips Symposium 2020: 1-18 - [c2]Yunhyeok Choi, Bohdan Karpinskyy, Kyoung-Moon Ahn, Yongsoo Kim, Soonkwan Kwon, Jieun Park, Yongki Lee, Mijung Noh:
27.4 Physically Unclonable Function in 28nm FD801 Technology Achieving High Reliability for AEC-Q100 Grade 1 and 1SO26262 ASIL-B. ISSCC 2020: 426-428
2010 – 2019
- 2016
- [c1]Bohdan Karpinskyy, Yongki Lee, Yunhyeok Choi, Yongsoo Kim, Mijung Noh, Sanghyun Lee:
8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips. ISSCC 2016: 158-160
Coauthor Index
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