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Hananeh Aliee
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2020 – today
- 2023
- [i5]Hananeh Aliee, Ferdinand Kapl, Soroor Hediyeh-Zadeh, Fabian J. Theis:
Conditionally Invariant Representation Learning for Disentangling Cellular Heterogeneity. CoRR abs/2307.00558 (2023) - [i4]Alejandro Tejada-Lapuerta, Paul Bertin, Stefan Bauer, Hananeh Aliee, Yoshua Bengio, Fabian J. Theis:
Causal machine learning for single-cell genomics. CoRR abs/2310.14935 (2023) - 2022
- [c11]Hananeh Aliee, Till Richter, Mikhail Solonin, Ignacio Ibarra, Fabian J. Theis, Niki Kilbertus:
Sparsity in Continuous-Depth Neural Networks. NeurIPS 2022 - [i3]Hananeh Aliee, Till Richter, Mikhail Solonin, Ignacio Ibarra, Fabian J. Theis, Niki Kilbertus:
Sparsity in Continuous-Depth Neural Networks. CoRR abs/2210.14672 (2022) - 2021
- [c10]Malte Lücken, Daniel Burkhardt, Robrecht Cannoodt, Christopher Lance, Aditi Agrawal, Hananeh Aliee, Ann Chen, Louise Deconinck, Angela Detweiler, Alejandro Granados, Shelly Huynh, Laura Isacco, Yang Kim, Dominik Klein, Bony de Kumar, Sunil Kuppasani, Heiko Lickert, Aaron McGeever, Joaquin Melgarejo, Honey Mekonen, Maurizio Morri, Michaela Müller, Norma Neff, Sheryl Paul, Bastian Rieck, Kaylie Schneider, Scott Steelman, Michael Sterr, Daniel Treacy, Alexander Tong, Alexandra-Chloé Villani, Guilin Wang, Jia Yan, Ce Zhang, Angela Pisco, Smita Krishnaswamy, Fabian J. Theis, Jonathan M. Bloom:
A sandbox for prediction and integration of DNA, RNA, and proteins in single cells. NeurIPS Datasets and Benchmarks 2021 - [i2]Hananeh Aliee, Fabian J. Theis, Niki Kilbertus:
Beyond Predictions in Neural ODEs: Identification and Interventions. CoRR abs/2106.12430 (2021)
2010 – 2019
- 2019
- [c9]Hananeh Aliee, Faramarz Khosravi, Jürgen Teich:
Efficient Treatment of Uncertainty in System Reliability Analysis using Importance Measures. DSN 2019: 76-87 - 2017
- [b1]Hananeh Aliee:
Reliability Analysis and Optimization of Embedded Systems using Stochastic Logic and Importance Measures. University of Erlangen-Nuremberg, Germany, 2017 - [j5]Hananeh Aliee, Emanuele Borgonovo, Michael Glaß, Jürgen Teich:
On the Boolean extension of the Birnbaum importance to non-coherent systems. Reliab. Eng. Syst. Saf. 160: 191-200 (2017) - [c8]Faramarz Khosravi, Hananeh Aliee, Jürgen Teich:
System-level reliability analysis considering imperfect fault coverage. ESTIMedia 2017: 68-77 - [c7]Hananeh Aliee, Abbas BanaiyanMofrad, Michael Glaß, Jürgen Teich, Nikil D. Dutt:
Redundancy-aware Design Space Exploration for Memory Reliability in Many-cores. MBMV 2017: 1-12 - 2016
- [j4]Emanuele Borgonovo, Hananeh Aliee, Michael Glaß, Jürgen Teich:
A new time-independent reliability importance measure. Eur. J. Oper. Res. 254(2): 427-442 (2016) - [c6]Hananeh Aliee, Stefan Vitzethum, Michael Glaß, Jürgen Teich, Emanuele Borgonovo:
Guiding Genetic Algorithms using importance measures for reliable design of embedded systems. DFT 2016: 53-56 - 2015
- [j3]Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis:
Application-aware cross-layer reliability analysis and optimization. it Inf. Technol. 57(3): 159-169 (2015) - 2014
- [j2]Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich:
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. Microelectron. Reliab. 54(6-7): 1066-1074 (2014) - [c5]Hananeh Aliee, Michael Glaß, Faramarz Khosravi, Jürgen Teich:
An efficient technique for computing importance measures in automatic design of dependable embedded systems. CODES+ISSS 2014: 3:1-3:10 - [i1]Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Michael Glaß, Faramarz Khosravi, Mehdi Baradaran Tahoori:
Towards Cross-layer Reliability Analysis of Transient and Permanent Faults. CoRR abs/1405.2914 (2014) - 2013
- [j1]Hananeh Aliee, Hamid R. Zarandi:
A Fast and Accurate Fault Tree Analysis Based on Stochastic Logic Implemented on Field-Programmable Gate Arrays. IEEE Trans. Reliab. 62(1): 13-22 (2013) - [c4]Hananeh Aliee, Michael Glaß, Felix Reimann, Jürgen Teich:
Automatic success tree-based reliability analysis for the consideration of transient and permanent faults. DATE 2013: 1621-1626 - 2011
- [c3]Hananeh Aliee, Hamid R. Zarandi:
An efficient, dynamically adaptive method to tolerate transient faults in multi-core systems. EWDC 2011: 53-58 - [c2]Hananeh Aliee, Hamid R. Zarandi, Alireza Tajary:
CPU-aware, process-level redundancy to tolerate faults in multi-core. HPCS 2011: 343-349 - [c1]Hananeh Aliee, Hamid R. Zarandi:
A Fault-Tolerant, Dynamically Scheduled Pipeline Structure for Chip Multiprocessors. SAFECOMP 2011: 324-337
Coauthor Index
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