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Hyun Woo Choi
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2010 – 2019
- 2019
- [j9]Thomas Moon
, Hyun Woo Choi, David C. Keezer
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition. J. Electron. Test. 35(6): 809-822 (2019) - 2016
- [j8]Nicholas Tzou, Debesh Bhatta, Xian Wang, Te-Hui Chen, Sen-Wen Hsiao, Barry J. Muldrey
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(6): 859-870 (2016) - 2015
- [j7]Nicholas Tzou, Debesh Bhatta, Barry J. Muldrey
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware. J. Electron. Test. 31(1): 85-98 (2015) - [j6]Thomas Moon, Hyun Woo Choi, Nicholas Tzou, Abhijit Chatterjee:
Wideband Sparse Signal Acquisition With Dual-rate Time-Interleaved Undersampling Hardware and Multicoset Signal Reconstruction Algorithms. IEEE Trans. Signal Process. 63(24): 6486-6497 (2015) - [c19]David C. Keezer
An FPGA-based ATE extension module for low-cost multi-GHz memory test. ETS 2015: 1-6 - 2014
- [j5]Hyun Woo Choi, Thomas Moon, Abhijit Chatterjee:
Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock Recovery. IEEE Trans. Instrum. Meas. 63(12): 2733-2749 (2014) - [c18]Thomas Moon, Hyun Woo Choi, David C. Keezer
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. VTS 2014: 1-6 - 2013
- [j4]Sehun Kook, Hyun Woo Choi, Abhijit Chatterjee:
Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. IEEE Trans. Very Large Scale Integr. Syst. 21(3): 454-464 (2013) - [c17]Suvadeep Banerjee
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Asian Test Symposium 2013: 277-282 - [c16]Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee:
Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling. VTS 2013: 1-6 - 2012
- [j3]Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee:
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. 28(4): 405-419 (2012) - [j2]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - [c15]Debesh Bhatta, Nicholas Tzou, Hyun Woo Choi, Abhijit Chatterjee:
Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth Interleaving. Asian Test Symposium 2012: 196-201 - [c14]David C. Keezer
Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. ITC 2012: 1-11 - [c13]Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee:
Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling. ITC 2012: 1-9 - [c12]Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee:
Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization. ITC 2012: 1-10 - [c11]Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee:
Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. ITC 2012: 1-10 - [c10]Nicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee:
Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution. VTS 2012: 140-145 - [c9]Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee:
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. VTS 2012: 146-151 - 2011
- [j1]Hyun Woo Choi, Alfred V. Gomes, Abhijit Chatterjee:
Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms. IEEE Trans. Very Large Scale Integr. Syst. 19(7): 1125-1135 (2011) - 2010
- [b1]Hyun Woo Choi:
Jitter measurement of high-speed digital signals using low-cost signal acquisition hardware and associated algorithms. Georgia Institute of Technology, Atlanta, GA, USA, 2010 - [c8]Hyun Woo Choi, Abhijit Chatterjee:
Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling. Asian Test Symposium 2010: 9-14 - [c7]Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee:
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium 2010: 283-288
2000 – 2009
- 2009
- [c6]Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74 - [c5]Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326 - 2008
- [c4]Hyun Woo Choi, Abhijit Chatterjee:
Digital bit stream jitter testing using jitter expansion. DATE 2008: 1468-1473 - [c3]Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee:
Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. ETS 2008: 41-46 - [c2]Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee:
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. ITC 2008: 1-10 - 2007
- [c1]Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee:
Enhanced Resolution Jitter Testing Using Jitter Expansion. VTS 2007: 104-109
Coauthor Index
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