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Andreas Glowatz
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2020 – today
- 2024
- [c21]Stephan Eggersglüß, Andreas Glowatz:
A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. ITC 2024: 41-45 - 2023
- [c20]Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz:
Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. ITC 2023: 286-292 - 2022
- [j5]Jean-François Côté
, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers
Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test 39(5): 17-25 (2022) - 2021
- [j4]Friedrich Hapke
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 584-597 (2021) - [c19]Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz:
On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. ATS 2021: 103-108
2010 – 2019
- 2018
- [c18]Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski:
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC 2018: 1-10 - 2014
- [j3]Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast:
Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(9): 1396-1409 (2014) - [c17]Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski:
Cell-aware experiences in a high-quality automotive test suite. ETS 2014: 1-6 - 2013
- [c16]Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke:
Fault collapsing of multi-conditional faults. DDECS 2013: 42-47 - 2012
- [c15]Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
A new SAT-based ATPG for generating highly compacted test sets. DDECS 2012: 230-235 - [c14]Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz:
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD 2012: 823-829 - [c13]Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski:
Cell-aware Production test results from a 32-nm notebook processor. ITC 2012: 1-9 - 2011
- [c12]Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers:
Cell-aware analysis for small-delay effects and production test results from different fault models. ITC 2011: 1-8 - 2010
- [j2]Stephan Eggersglüß, Görschwin Fey
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. 26(3): 307-322 (2010) - [c11]Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger:
Defect-oriented cell-internal testing. ITC 2010: 285-294
2000 – 2009
- 2009
- [c10]Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10 - [c9]Marc Messing, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
Using a two-dimensional fault list for compact Automatic Test Pattern Generation. LATW 2009: 1-6 - [c8]Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz:
Restrict Encoding for Mixed-Mode BIST. VTS 2009: 179-184 - 2008
- [j1]Rolf Drechsler
On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1329-1333 (2008) - 2007
- [c7]Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel:
Computation and Application of Absolute Dominators in Industrial Designs. ETS 2007: 137-144 - [c6]Stephan Eggersglüß, Daniel Tille, Görschwin Fey
Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6 - [c5]Jeroen Geuzebroek, Erik Jan Marinissen
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC 2007: 1-10 - [c4]Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef:
Programmable deterministic Built-In Self-Test. ITC 2007: 1-9 - [c3]Stephan Eggersglüß, Görschwin Fey
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187 - 2006
- [c2]Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke:
Fault detection and diagnosis with parity trees for space compaction of test responses. DAC 2006: 1095-1098 - 2005
- [c1]Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel:
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217
Coauthor Index
aka: Juergen Schloeffel
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