More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

International Workshop on Usability and Accessibility Focused Requirements Engineering (UsARE)

> Home > Conferences and Workshops

Venue statistics

records by year

document access Please note:
▪ This facet is still work in progress.
▪ Open access information for publications is still rather incomplete.

frequent authors

Venue Information

is part of: IEEE International Requirements Engineering Conference (RE)

2nd UsARE@RE 2014: Karlskrona, Sweden

- view
- export record
  dblp key:
  - conf/re/2014usare
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/re/2014usare
Shah Rukh Humayoun, Norbert Seyff, Nauman A. Qureshi, Anna Perini, Achim Ebert, David Callele, Simone D. J. Barbosa:
IEEE 2nd International Workshop on Usability and Accessibility Focused Requirements Engineering, UsARE 2014, 25-25 August, 2014, Karlskrona, Sweden. IEEE Computer Society 2014, ISBN 978-1-4799-6352-2 [contents]

1st UsARE@RE 2012: Zurich, Switzerland

- view
  authority control:
- export record
  dblp key:
  - conf/re/2014usareS
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/re/2014usareS
Achim Ebert, Shah Rukh Humayoun, Norbert Seyff, Anna Perini, Simone D. J. Barbosa:
Usability- and Accessibility-Focused Requirements Engineering - First International Workshop, UsARE 2012, Held in Conjunction with ICSE 2012, Zurich, Switzerland, June 4, 2012 and Second International Workshop, UsARE 2014, Held in Conjunction with RE 2014, Karlskrona, Sweden, August 25, 2014, Revised Selected Papers. Lecture Notes in Computer Science 9312, Springer 2016, ISBN 978-3-319-45915-8 [contents]

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.