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18. FTCS 1988: Tokyo, Japan
- Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988. IEEE Computer Society 1988, ISBN 0-8186-0867-6
- Peter G. Bishop, F. D. Pullen:
PODS revisited-a study of software failure behaviour. 2-8 - John P. J. Kelly, David E. Jr. Eckhardt, Mladen A. Vouk, David F. McAllister, Alper K. Caglayan:
A large scale second generation experiment in multi-version software: description and early results. 9-14 - Algirdas Avizienis, Michael R. Lyu, Werner Schütz:
In search of effective diversity: a six-language study of fault-tolerant flight control software. 15-22 - Kwang-Ting Cheng, Vishwani D. Agrawal, Ernest S. Kuh:
A sequential circuit test generation using threshold-value simulation. 24-29 - Michael H. Schulz, Elisabeth Auth:
Advanced automatic test pattern generation and redundancy identification techniques. 30-35 - Hans-Joachim Wunderlich, Sybille Hellebrand:
Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits. 36-41 - Robert E. Strom, David F. Bacon, Shaula Yemini:
Volatile logging in n-fault-tolerant distributed systems. 44-49 - Kwang-Hae Kim, J. C. Yoon:
Approaches to implementation of a repairable distributed recovery block scheme. 50-55 - Robert F. Cmelik, Narain H. Gehani, William D. Roome:
Fault tolerant concurrent C: a tool for writing fault tolerant distributed programs. 56-61 - Hideo Fujiwara:
Computational complexity of controllability/observability problems for combinational circuits. 64-69 - André Ivanov, Vinod K. Agarwal:
An iterative technique for calculating aliasing probability of linear feedback signature registers. 70-75 - Gabriel M. Silberman, Ilan Y. Spillinger:
RIDDLE: a foundation for test generation on a high level design description. 76-81 - John F. Meyer, Lu Wei:
Analysis of workload influence on dependability. 84-89 - Kamel Barkaoui, Gerard Florin, Céline Fraize, Bernard Lemaire, Stéphane Natkin:
Reliability analysis of non repairable systems using stochastic Petri nets. 90-95 - Marco Mulazzani:
An open layered architecture for dependability analysis and its application. 96-101 - Zary Segall, Dalibor F. Vrsalovic, Daniel P. Siewiorek, David A. Yaskin, J. Kownacki, James H. Barton, R. Dancey, A. Robinson, T. Lin:
FIAT-fault injection based automated testing environment. 102-107 - Vijay S. Iyengar, Donald T. Tang:
On simulating faults in parallel. 110-115 - Shigeharu Teshima, Naoya Chujo, Noriyoshi Sano, Hiroshi Nagase, Mitsuharu Takigawa:
Accelerated fault simulation by propagating disjoint fault-sets. 116-121 - Fadi Maamari, Janusz Rajski:
A reconvergent fanout analysis for efficient exact fault simulation of combinational circuits. 122-127 - Gianpiero Cabodi, Silvano Gai, Marco Mezzalama, Pier Luca Montessoro, Fabio Somenzi:
Fault simulation in a multilevel environment: the MOZART approach. 128-133 - Bjarne E. Helvik
:
Modelling the influence of unreliable software in distributed computer systems. 136-141 - Jean Arlat, Karama Kanoun, Jean-Claude Laprie:
Dependability evaluation of software fault-tolerance. 142-177 - Ken-ichi Matsumoto, Katsuro Inoue, Tohru Kikuno, Koji Torii:
Experimental evaluation of software reliability growth models. 148-153 - Michael Nicolaidis:
A unified built-in-test scheme: UBIST. 157-163 - Rajiv Sharma, Kewal K. Saluja:
An implementation and analysis of a concurrent built-in self-test technique. 164-169 - Naofumi Takagi, Shuzo Yajima:
An on-line error-detectable array divider with a redundant binary representation and a residue code. 174-179 - Suku Nair, Jacob A. Abraham:
General linear codes for fault-tolerant matrix operations on processor arrays. 180-185 - Bernhard G. Zagar, G. Robert Redinbo:
Watchdog parity channels for digital filter protection. 186-191 - Kikuo Fujimura, Pankaj Jalote:
Robust search methods for B-trees. 194-199 - Jean-Claude Fabre, Yves Deswarte, Jean-Claude Laprie, David Powell:
Saturation: reduced idleness for improved fault-tolerance. 200-205 - Flaviu Cristian:
Agreeing on who is present and who is absent in a synchronous distributed system. 206-211 - Sung Je Hong:
An easily testable parallel multiplier. 214-219 - Sandip Kundu, Sudhakar M. Reddy:
On the design of robust testable CMOS combinational logic circuits. 220-225 - Jien-Chung Lo, Suchai Thanawastien:
The design of fast totally self-checking Berger code checkers based on Berger code partitioning. 226-231 - Yuval Tamir, Marc Tremblay, David A. Rennels:
The implementation and application of micro rollback in fault-tolerant VLSI systems. 234-239 - Jaynarayan H. Lala, Linda S. Alger:
Hardware and software fault tolerance: a unified architectural approach. 240-245 - David Powell, Gottfried Bonn, Douglas T. Seaton, Paulo Veríssimo, F. Waeselynck:
The Delta-4 approach to dependability in open distributed computing systems. 246-251 - Richard E. Harper, Jaynarayan H. Lala, John J. Deyst:
Fault tolerant parallel processor architecture overview. 252-257 - Douglas M. Blough, Gregory F. Sullivan, Gerald M. Masson:
Almost certain diagnosis for intermittently faulty systems. 260-265 - Edward F. Schmeichel, S. Louis Hakimi, M. Otsuka, Geoff Sullivan:
On minimizing testing rounds for fault identification. 266-271 - Tohru Kohda, Ken-ichi Abiru:
A recursive procedure for optimally designing a hybrid fault diagnosable system. 272-277 - Sampath Rangarajan, Donald S. Fussell:
A probabilistic method for fault diagnosis of multiprocessor systems. 278-283 - Kurt H. Thearling, Ravishankar K. Iyer:
Diagnostic reasoning in digital systems. 286-291 - Janusz Rajski:
GEMINI-a logic system for fault diagnosis based on set functions. 292-297 - James T. Blake, Kishor S. Trivedi:
Reliabilities of two fault-tolerant interconnection networks. 300-305 - Bryan Eric Aupperle, John F. Meyer:
Fault-tolerant BIBD networks. 306-311 - Yitzhak Dishon, T. S. Liu:
Disk dual copy methods and their performance. 314-319 - Anujan Varma, Joydeep Ghosh, Christos J. Georgiou:
Reliable design of large crosspoint switching networks. 320-325 - Shantanu Dutt, John P. Hayes:
Design and reconfiguration strategies for near-optimal k-fault-tolerant tree architectures. 328-333 - Masahiro Tsunoyama, Sachio Naito:
A fault-tolerant parallel processor modeled by a linear cellular automaton. 334-339 - Fabrizio Lombardi, Wei-Kang Huang:
Approaches for the repair of VLSI/WSI RRAMs by row/column deletion. 342-347 - Nany Hasan, C. L. Liu:
Minimum fault coverage in reconfigurable arrays. 348-353 - Kazumitsu Matsuzawa, Eiji Fujiwara:
Masking asymmetric line faults using semi-distance codes. 354-359 - Prithviraj Banerjee, Joseph T. Rahmeh, Craig B. Stunkel, V. S. S. Nair, Kaushik Roy, Jacob A. Abraham:
An evaluation of system-level fault tolerance on the Intel hypercube multiprocessor. 362-367 - Shyh-Kwei Chen, Chungti Liang, Wei-Tek Tsai:
An efficient multi-dimensional grids reconfiguration algorithm on hypercube. 368-373 - Tinghuai Chen, Tai Kang, Rong Yao:
The connectivity of hypergraph and the design of fault-tolerant multibus systems. 374-379 - Takashi Nanya, Samiha Mourad, Edward J. McCluskey:
Multiple stuck-at fault testability of self-testing checkers. 381-386
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