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Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light

Crossref DOI link: https://doi.org/10.1007/s11432-021-3377-2

Published Online: 2022-10-28

Published Print: 2023-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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