Static secondary-ion mass spectrometry (Q3943651)
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mass spectrometric technique used to analyze the composition of solid surfaces
- SSIMS
- Static secondary ion mass spectrometry
- Static SIMS
- S-SIMS
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Static secondary-ion mass spectrometry |
mass spectrometric technique used to analyze the composition of solid surfaces |
|
Statements
Identifiers
1 reference
Sitelinks
Wikipedia(3 entries)
- enwiki Static secondary-ion mass spectrometry
- itwiki SIMS statico
- ptwiki ToF-SIMS