Using DL Models in the Service Layer to Enhance the Fault Tolerance of IoT Networks
<p>An example IoT network illustrating different layers.</p> "> Figure 2
<p>Overall methodology for effecting improvements in fault tolerance of the IoT network up to the service layer.</p> "> Figure 3
<p>Service architecture of an IoT network.</p> "> Figure 4
<p>The method handles missing data in the service layer.</p> "> Figure 5
<p>Prototype non-linear network.</p> "> Figure 6
<p>Linearized IoT network.</p> "> Figure 7
<p>FTA diagram for sample IoT network.</p> ">
Abstract
:1. Introduction
- To build middleware in service servers that sense the existence of missing data and use learning models to predict the missing data and complete the data so that the analytical models can be used more effectively to monitor and control mission-critical systems.
- To show how the fault tolerance of the IoT network remains unchanged even in the case of the failure of some devices from a data-availability perspective.
2. Related Work
3. Overall Methodology
4. Service Layer Architectural Model
5. Method for Inline Data Correction
6. Prototype IoT Network
7. Description of Example Dataset
8. The Issue of Missing Data and Channelling the Data in Sequences
9. Model Learning
10. Results and Discussion
- MLP–regression
- LSTM–regression
- LSTM–regression with equal time stamps as lookbacks
- LSTM–Regression with equal time stamps as lookbacks and network states preserved
- LSTM–regression with equal time stamps as lookbacks and network states preserved, and memory remembered between the batches.
11. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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Layer | Inventions Implemented |
---|---|
Device layer | A crossbar network was implemented to make available several alternate paths for communication. |
A method to predict the occurrence of power faults and isolate the devices that might inject a power fault into systems is being submitted to MDPI’s Sensors journal | |
Base station layer | Implementing dual base stations within an IoT network to sustain the fault tolerance of an IoT |
Network through an efficient path-finding algorithm [22] | |
Controller layer | Networking microcontrollers to address the failure of controllers |
To implement a load-balancing system so that the load on the servers is equally managed | |
Performing the sequencing of data emanating from a cluster and preparing a group data packet, which has been submitted to the MDPI’s journal Mathematics | |
Service-layer | Improving the quality of data (this paper) in the presence of device failures |
Gateway layer | Enhancing the fault tolerance of a multi-layered IoT network through rectangular and interstitial |
mesh in the gateway layer [23] |
Step Number | Process Undertaken |
---|---|
1 | Capture an IoT network’s hierarchy of hardware elements and update a database. |
2 | Capture the clusters existing in the IoT diagram, convert it to a hierarchical model, and update the items in the database. |
3 | Update the database with the fault rate of the devices obtained from the manufacturers. |
4 | For each network topology, compute the success rate, and include a device in its place associated with the calculated success rate. |
4 | Capture the relationship (or, and) between each device and its predecessors, and update the database. |
5 | Generate the linear tree into a graph model. |
Step Number | Process Undertaken |
---|---|
1 | Query the elements from the database in the hierarchical order of preceding relationships connected from the child nodes. |
2 | Using and–or rules, compute the outgoing device’s fault rate. |
3 | If the relationship between the devices is an and relationship, an outgoing device’s fault rate is multiplied by the incoming device’s fault rate. |
4 | If the relationship between the devices is an or relationship, the outgoing device’s fault rate is the lowest of the incoming devices’ fault rates. |
5 | Calculate the fault rate of the root device. A root device has no parents. |
6 | Generate a fault-computation table. |
S No. | Device | Success Rate | Gates Used for Connection | Preceding Devices | Combined Success Rate | |||
---|---|---|---|---|---|---|---|---|
Device 1 | Device 2 | Device 3 | Device 4 | |||||
Success Rate 1 | Success Rate 2 | Success Rate 3 | Success Rate 4 | |||||
1 | Cluster Head 1 | 0.950 | 0.950 | |||||
2 | Cluster Head 2 | 0.950 | 0.950 | |||||
3 | Cluster Head 3 | 0.950 | 0.950 | |||||
4 | Cluster Head 4 | 0.950 | 0.950 | |||||
5 | D1 | 0.950 | Or | Cluster Head 1 0.950 | 0.950 | |||
6 | D2 | 0.950 | Or | Cluster Head 2 0.950 | 0.950 | |||
7 | D3 | 0.950 | Or | Cluster Head 3 0.950 | 0.950 | |||
8 | D4 | 0.950 | Or | Cluster Head 4 0.950 | 0.950 | |||
9 | Device level CrossBar NW | 0.987 | Or | D1 0.950 | 0.987 | |||
10 | Device level CrossBar NW | 0.987 | Or | D2 0.950 | 0.987 | |||
11 | Device level CrossBar NW | 0.987 | Or | D3 0.950 | 0.987 | |||
12 | Device level CrossBar NW | 0.987 | Or | D4 0.950 | 0.987 | |||
13 | D5 | 0.950 | Or | DLCB 0.987 | 0.987 | |||
14 | D6 | 0.950 | Or | DLCB 0.987 | 0.987 | |||
15 | D7 | 0.950 | Or | DLCB 0.987 | 0.987 | |||
16 | D8 | 0.950 | Or | DLCB 0.987 | 0.987 | |||
17 | Base Station 1 | 0.950 | Or | D5 0.987 | D6 0.987 | D7 0.987 | D8 0.987 | 0.987 |
18 | RL1 | 0.950 | Or | CH1 0.950 | CH2 0.950 | 0.950 | ||
19 | RL2 | 0.950 | Or | CH2 0.950 | CH3 0.950 | 0.950 | ||
20 | RL3 | 0.950 | Or | CH3 0.950 | CH4 0.950 | 0.950 | ||
21 | RL4 | 0.950 | Or | RL1 0.950 | RL2 0.950 | 0.950 | ||
22 | RL5 | 0.950 | Or | RL1 0.950 | RL2 0.950 | 0.950 | ||
23 | Base Station 2 | 0.950 | Or | RL4 0.950 | RL5 0.950 | 0.950 | ||
24 | Controller 1 | 0.979 | Or | BS1 0.987 | BS1 0.950 | 0.987 | ||
25 | Controller 2 | 0.979 | Or | BS1 0.987 | BS1 0.950 | 0.987 | ||
26 | Controller 3 | 0.979 | Or | BS1 0.987 | BS1 0.950 | 0.987 | ||
27 | Controller Level CrossBar NW | 0.970 | CROSSBAR NW | Controller 1 0.987 | Controller 2 0.987 | Controller 3 0.987 | 0.987 | |
28 | Server 1 | 0.980 | And | CLCB 0.987 | 0.967 | |||
29 | Server 2 | 0.980 | And | CLCB 0.987 | 0.967 | |||
30 | Server 3 | 0.980 | And | CLCB 0.987 | 0.967 | |||
31 | Gateway | 0.980 | Or | Server 1 0.967 | Server 2 0.967 | Server 3 0.967 | 0.980 | |
32 | INTERNET | 0.980 | And | Gateway 0.980 | 0.960 |
Period | Parameter Sensed | Temperature Measured |
---|---|---|
t1 | Temp-1 | 78 |
t2 | Temp-2 | 79 |
t3 | Temp-3 | 80 |
t4 | Temp-1 | 78 |
t5 | Temp-2 | 78 |
t6 | Temp-3 | 78 |
t7 | Temp-1 | 80 |
t8 | Temp-2 | 79 |
t9 | Temp-3 | 78 |
Type Model | Type of Method | Type of Layer | Number of Inputs | Number of Outputs | Type of Activation |
---|---|---|---|---|---|
MLP | Regression with Lookup = 3 | Dense | 3 | 8 | RELU |
Dense | 8 | 1 | - | ||
Model Parameters | |||||
Loss function | Mean squared error | Optimizer | Adams | ||
LSTM | Regression with Lookup = 3 | LSTM | 3 | 4 | - |
Dense | 4 | 1 | - | ||
Model Parameters | |||||
Loss Function | Mean squared error | Optimizer | Adam | ||
LSTM | Regression with Lookup = 3 | LSTM | 3 | 4 | - |
Dense | 4 | 1 | - | ||
Model Parameters | |||||
Loss function | Mean squared error | Optimizer | Adam | ||
LSTM | Regression | LSTM | 3 | 4 | - |
with | |||||
Lookup = 3 | |||||
With time stamps = 3 | Dense | 4 | 1 | - | |
and Maintaining | Model Parameters | ||||
Network shape | Loss function | Mean squared error | Optimizer | Adam | |
LSTM | Regression | LSTM | 3 | 4 | - |
with | |||||
Lookup = 3 | LSTM | 4 | 4 | ||
With time stamps = 3 | Dense | 4 | 1 | - | |
and Maintaining | Model Parameters | ||||
Network shape with memory between the states | Loss function | Mean squared error | Optimiser | Adam |
Model- Classifier | MLP- Regression—3 Lookups | LSTM- Regression—3 Lookups | LSTM- Regression-3 Lookups and 3 Time Steps | LSTM- Regression-3 Lookups and 3 Time Steps and Maintaining Network States After Every Epoch | LSTM- Regression-3 Lookups and 3 Time Steps and Maintaining Network States After Every Epoch and Memory Between the Batches | ||||||
---|---|---|---|---|---|---|---|---|---|---|---|
Epochs | Batch Size | RMSE | Average Response Time per step in (uS) | RMSE | Average Response Time per step in (uS) | RMSE | Average Response Time per step in (uS) | RMSE | Average Response Time per step in (uS) | RMSE | Average Response Time per step in (uS) |
100 | 2 | 1.15 | 442 | 0.95 | 2000 | 0.92 | 1000 | 0.52 | 710 | 19.02 | 1100 |
200 | 2 | 1.09 | 675 | 0.89 | 2000 | 0.88 | 736 | 0.69 | 717 | 17.85 | 1000 |
300 | 2 | 1.36 | 1000 | 0.85 | 829 | 0.85 | 1000 | 0.34 | 671 | 19.08 | 1000 |
400 | 2 | 1.15 | 895 | 0.82 | 2000 | 0.82 | 1000 | 0.46 | 709 | 17.36 | 990 |
500 | 2 | 1.51 | 803 | 0.72 | 1000 | 0.74 | 1000 | 0.57 | 727 | 19.34 | 1000 |
600 | 2 | 1.08 | 642 | 0.76 | 1000 | 0.75 | 1000 | 0.41 | 741 | 17.37 | 1000 |
700 | 2 | 1.13 | 822 | 0.69 | 999 | 0.78 | 1000 | 0.35 | 884 | 19.26 | 1000 |
800 | 2 | 1.08 | 762 | 0.63 | 824 | 0.61 | 1000 | 0.41 | 752 | 16.97 | 809 |
900 | 2 | 1.07 | 711 | 0.64 | 867 | 0.61 | 1000 | 0.35 | 781 | 18.96 | 1000 |
1000 | 2 | 1.09 | 486 | 0.65 | 869 | 0.6 | 889 | 0.85 | 725 | 16.85 | 1000 |
Serial Number | Parameter Used | LSM [22] | MVARM [23] | RM [24] | LSTM-RMSE |
---|---|---|---|---|---|
1 | Use of data sequences | N | N | N | Y |
2 | Use of timing of data | N | N | N | Y |
3 | Use of backup sensors | Y | Y | N | N |
4 | Spread of solutions | N | N | Y | Y |
5 | Use of multi-model relationships | Y | Y | Y | N |
6 | Accuracy in percentage | 90.68 | 88.42 | 90.02 | 99.66 |
7 | Response time in microseconds | 1120 | 1700 | 1800 | 671 |
S No. | Number of Packets Transmitted | Number of Packets with Completed Data | % of Complete Packets Received | Success Rate of the IoT Network | Success Rate due Decrease in Complete Data Packets | Decrease in Fault Tolerance | Completed Packets Received Due to Implement Ation of LSTM-RMSE | Success Rate After the Impleme Ntation of Middle Ware | Improvement in Fault Tolerance Rate Due to LSTM-RMSE |
---|---|---|---|---|---|---|---|---|---|
1 | 100 | 90 | 90 | 0.98 | 0.882 | 0.098 | 99.66 | 0.977 | 0.095 |
2 | 150 | 92 | 61.33 | 0.98 | 0.601 | 0.379 | 99.66 | 0.977 | 0.376 |
3 | 160 | 89 | 55.63 | 0.98 | 0.545 | 0.435 | 99.66 | 0.977 | 0.432 |
4 | 200 | 160 | 80 | 0.98 | 0.784 | 0.196 | 99.66 | 0.977 | 0.193 |
5 | 300 | 243 | 81 | 0.98 | 0.794 | 0.186 | 99.66 | 0.977 | 0.183 |
6 | 400 | 321 | 80.25 | 0.98 | 0.786 | 0.194 | 99.66 | 0.977 | 0.19 |
7 | 500 | 432 | 86.4 | 0.98 | 0.847 | 0.133 | 99.66 | 0.977 | 0.13 |
8 | 600 | 444 | 74 | 0.98 | 0.725 | 0.255 | 99.66 | 0.977 | 0.251 |
9 | 700 | 560 | 80 | 0.98 | 0.784 | 0.196 | 99.66 | 0.977 | 0.193 |
10 | 800 | 590 | 73.75 | 0.98 | 0.723 | 0.257 | 99.66 | 0.977 | 0.254 |
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Jammalamadaka, S.K.R.; Chokara, B.; Jammalamadaka, S.B.; Duvvuri, B.K. Using DL Models in the Service Layer to Enhance the Fault Tolerance of IoT Networks. Electronics 2024, 13, 4334. https://doi.org/10.3390/electronics13224334
Jammalamadaka SKR, Chokara B, Jammalamadaka SB, Duvvuri BK. Using DL Models in the Service Layer to Enhance the Fault Tolerance of IoT Networks. Electronics. 2024; 13(22):4334. https://doi.org/10.3390/electronics13224334
Chicago/Turabian StyleJammalamadaka, Sastry Kodanda Rama, Bhupati Chokara, Sasi Bhanu Jammalamadaka, and Balakrishna Kamesh Duvvuri. 2024. "Using DL Models in the Service Layer to Enhance the Fault Tolerance of IoT Networks" Electronics 13, no. 22: 4334. https://doi.org/10.3390/electronics13224334
APA StyleJammalamadaka, S. K. R., Chokara, B., Jammalamadaka, S. B., & Duvvuri, B. K. (2024). Using DL Models in the Service Layer to Enhance the Fault Tolerance of IoT Networks. Electronics, 13(22), 4334. https://doi.org/10.3390/electronics13224334