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- Hu WWu LTai YTan JZhang J(2020)A Unified Formal Model for Proving Security and Reliability Properties2020 IEEE 29th Asian Test Symposium (ATS)10.1109/ATS49688.2020.9301533(1-6)Online publication date: 23-Nov-2020
- Devarajegowda KEcker W(2018)Meta-model Based Automation of Properties for Pre-Silicon Verification2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)10.1109/VLSI-SoC.2018.8644957(231-236)Online publication date: Oct-2018
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