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A methodology to improve yield in analog circuits by using geometric programming

Published: 06 September 2010 Publication History

Abstract

A CAD methodology to design analog circuits via geometric programming (GP) involving manufacturing issues is proposed. A functional approach by sensitivity analysis from dimensional variables is used to obtain the design space. A mismatch analysis using the Pelgrom's model defines the minimum area to ensure parametric yield requirements. With the information on the design space and minimum area, performance and yield are optimized with a new strategy called best-effort. This methodology is validated through the design of a sub-threshold voltage reference [1]. In this work a 3.25 ppm/C temperature coefficient is obtained with a deviation nine times lower but occupying the same area than the one using the GP strategy without manufacturing issues. Further, it is shown how an appropriate sizing can improve the yield up to 24%.

References

[1]
J. Mateus, E. Roa, H. Hernandez, and W. Van Noije, A 2.7ua sub1-v voltage reference," in SBCCI '08: Proceedings of the 21st annual symposium on Integrated circuits and system design. New York, NY, USA: ACM, 2008, pp. 81--84.
[2]
N. Jakatdar, DFM: What, Why, When & How," Solid State Technology and Devices Seminar EECS 298--12, UC at Berkeley, February 2007.
[3]
S. Director, Optimization of parametric yield," in Defect and Fault Tolerance on VLSI Systems, 1991. Proceedings., 1991 International Workshop on, nov 1991, pp. 1--18.
[4]
M. Pelgrom, A. Duinmaijer, and A. Welbers, Yield Optimization of Analog IC's Using Two-Step Analytic Modeling Methods," Solid-State Circuits, IEEE Journal of, vol. 28, no. 7, pp. 778{783, July 1993.
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B. Gregoire, Optimum area allocation for minimum mismatch {IC device area optimization}," in Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, oct. 2004, pp. 643--646.
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J. Oliveros, D. Cabrera, E. Roa, and W. Van Noije, An improved and automated design tool for the optimization of CMOS OTAs using geometric programming," in SBCCI '08: Proceedings of the 21st annual symposium on Integrated circuits and system design. New York, NY, USA: ACM, 2008, pp. 146--151.
[9]
M. Pelgrom, A. Duinmaijer, and A. Welbers, Matching properties of MOS transistors," Solid-State Circuits, IEEE Journal of, vol. 24, no. 5, pp. 1433--1439, Oct 1989.
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S. Boyd and L. Vandenberghe, Convex Optimization, 1st ed. Cambridge University Press, 2004.
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M. Grant and S. Boyd, CVX: Matlab software for disciplined convex programming," Internet, February 2009, build 711. {Internet}. Visite: http://stanford.edu/ boyd/cvx
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[13]
S.-C. Wong, K.-H. Pan, and D.-J. Ma, A CMOS mismatch model and scaling e ects," Electron Device Letters, IEEE, vol. 18, no. 6, pp. 261--263, jun 1997.

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    cover image ACM Conferences
    SBCCI '10: Proceedings of the 23rd symposium on Integrated circuits and system design
    September 2010
    228 pages
    ISBN:9781450301527
    DOI:10.1145/1854153
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 06 September 2010

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    Author Tags

    1. geometric programming
    2. mismatch
    3. optimization
    4. voltage reference
    5. yield

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