Resilient microprocessor design for high performance & energy efficiency

Conventional microprocessors require a clock frequency (F_CLK) guardband to ensure correct functionality during infrequent dynamic operating variations in supply voltage (V_CC), temperature, and transistor aging. Consequently, these inflexible designs cannot exploit opportunities for higher performance by increasing F_CLK or lower energy by reducing V_CC during favorable operating conditions. This presentation describes a 45nm resilient microprocessor with error-detection and recovery circuits to detect and correct timing errors from dynamic variations to mitigate the F_CLK guardband, thus enabling higher performance or lower energy as compared to a conventional design. The microprocessor core supports two distinct error-detection designs and two separate error-recovery techniques, allowing a direct comparison of the relative trade-offs. Silicon measurements demonstrate that resilient circuits enable a 41% throughput gain at equal energy or a 22% energy reduction at equal throughput, as compared to a conventional design when executing a benchmark program with a 10% V_CC droop. In addition, the resilient circuits guide an adaptive clock controller that tracks recovery cycles and adapts to persistent variations by changing F_CLK. The combination of error-detection and recovery circuits with dynamic adaptation allows the microprocessor to adapt to the operating environment to deliver maximum efficiency. The presentation concludes by discussing the opportunity of applying resilient techniques to enhance the dynamic operating range (i.e., high-performance and low-power modes) for microprocessors.