k-dimensional subspace of state variables are first shown. Then, almost regular arrays which can operate on maximum cycles are derived based on fast parallel implementations of LFSRs." />
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Design of Autonomous TPG Circuits for Use in Two-Pattern Testing

Kiyoshi FURUYA
Seiji SEKI
Edward J. McCLUSKEY

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E78-D    No.7    pp.882-888
Publication Date: 1995/07/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-test (BIST),  two-pattern test,  pseudorandom pattern generator,  autonomous linear sequential circuit,  transition coverage,  

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Summary: 
A method to design one-dimensional cellular arrays to be used as TPG circuits of BIST is described. The interconnections between cells are not limited to adjacent ones but allowed to some neighbors. Completely regular structures that have full-transition coverages for every k-dimensional subspace of state variables are first shown. Then, almost regular arrays which can operate on maximum cycles are derived based on fast parallel implementations of LFSRs.

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