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On Concurrent Error Detection with Bounded Latency in FSMs

Published: 16 February 2004 Publication History

Abstract

We discuss the problem of concurrent error detection (CED) with bounded latency in finite state machines (FSMs). The objective of this approach is to reduce the overhead of CED, albeit at the cost of introducing a small latency in the detection of errors. In order to ensure no loss of error detection capabilities as compared to CED without latency, an upper bound is imposed on the introduced latency. We examine the necessary conditions for performing CED with bounded latency, based on which we extend a parity-based method to permit bounded latency. We formulate the problem of minimizing the number of required parity bits as an Integer Program and we propose an algorithm based on Linear Program relaxation and Randomized Rounding to solve it. Experimental results indicate that allowing a small bounded latency reduces the hardware cost of the CED circuitry.

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Cited By

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  • (2012)Input vector monitoring on line concurrent BIST based on multilevel decoding logicProceedings of the Conference on Design, Automation and Test in Europe10.5555/2492708.2493016(1251-1256)Online publication date: 12-Mar-2012
  • (2004)Cost-Driven Selection of Parity TreesProceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987975Online publication date: 25-Apr-2004

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          cover image ACM Conferences
          DATE '04: Proceedings of the conference on Design, automation and test in Europe - Volume 1
          February 2004
          688 pages
          ISBN:0769520855

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          Published: 16 February 2004

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          • (2012)Input vector monitoring on line concurrent BIST based on multilevel decoding logicProceedings of the Conference on Design, Automation and Test in Europe10.5555/2492708.2493016(1251-1256)Online publication date: 12-Mar-2012
          • (2004)Cost-Driven Selection of Parity TreesProceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987975Online publication date: 25-Apr-2004

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