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Article

False-noise analysis using logic implications

Published: 04 November 2001 Publication History

Abstract

Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneously switch in the same direction. This creates a worst-case noise pulse on the victim net that often leads to false noise violations. In this paper, we present a new approach that uses logic implications to identify the maximum set of aggressor nets that can inject noise simultaneously under the logic constraints of the circuit. We propose an approach to efficiently generate logic implications from a transistor-level description and propagate them in the circuit using ROBDD representations and a newly proposed laterial propagation method. We then show that the problem of finding the worst case logically feasible noise can be represented as a maximum weighted independent set problem and show how to efficiently solve it. Initially, we restrict our discussion to zero-delay implications, which are valid for glitch-free circuits and then extend our approach to timed implications. The proposed approaches were implemented in an industrial noise analysis tool and results are shown for a number of industrial test cases. We demonstrate that a significant reduction in the number of noise failures can be obtained from considering the logic implications as proposed in this paper, underscoring the need for false-noise analysis.

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Cited By

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  • (2015)Variation aware cross-talk aggressor alignment by mixed integer linear programmingProceedings of the 52nd Annual Design Automation Conference10.1145/2744769.2744924(1-6)Online publication date: 7-Jun-2015
  • (2008)Incorporating logic exclusivity (LE) constraints in noise analysis using gain guided backtracking methodProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509626(783-789)Online publication date: 10-Nov-2008
  • (2007)Macro-Model for Post-Breakdown 90NM and 130NM Transistors and its Applications in Predicting Chip-Level Function Failure after ESD-CDM EventsProceedings of the 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual10.1109/RELPHY.2007.369872(78-85)Online publication date: 1-Apr-2007
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Information

Published In

cover image ACM Conferences
ICCAD '01: Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
November 2001
656 pages
ISBN:0780372492
  • Conference Chair:
  • Rolf Ernst

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IEEE Press

Publication History

Published: 04 November 2001

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ICCAD01
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ICCAD01: International Conference on Computer Aided Design
November 4 - 8, 2001
California, San Jose

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

View all
  • (2015)Variation aware cross-talk aggressor alignment by mixed integer linear programmingProceedings of the 52nd Annual Design Automation Conference10.1145/2744769.2744924(1-6)Online publication date: 7-Jun-2015
  • (2008)Incorporating logic exclusivity (LE) constraints in noise analysis using gain guided backtracking methodProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509626(783-789)Online publication date: 10-Nov-2008
  • (2007)Macro-Model for Post-Breakdown 90NM and 130NM Transistors and its Applications in Predicting Chip-Level Function Failure after ESD-CDM EventsProceedings of the 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual10.1109/RELPHY.2007.369872(78-85)Online publication date: 1-Apr-2007
  • (2005)Noise Library Characterization for Large Capacity Static Noise Analysis ToolsProceedings of the 6th International Symposium on Quality of Electronic Design10.1109/ISQED.2005.85(28-34)Online publication date: 21-Mar-2005
  • (2004)Eliminating False Positives in Crosstalk Noise AnalysisProceedings of the conference on Design, automation and test in Europe - Volume 210.5555/968879.969195Online publication date: 16-Feb-2004
  • (2004)False-Noise Analysis for Domino CircuitsProceedings of the conference on Design, automation and test in Europe - Volume 210.5555/968879.969173Online publication date: 16-Feb-2004
  • (2004)Delay noise pessimism reduction by logic correlationsProceedings of the 2004 IEEE/ACM International conference on Computer-aided design10.1109/ICCAD.2004.1382564(160-167)Online publication date: 7-Nov-2004
  • (2003)Temporofunctional crosstalk noise analysisProceedings of the 40th annual Design Automation Conference10.1145/775832.776048(860-863)Online publication date: 2-Jun-2003
  • (2003)Cross-Coupled Noise Propagation in VLSI DesignsAnalog Integrated Circuits and Signal Processing10.1023/A:102417441503435:2-3(133-142)Online publication date: 1-May-2003
  • (2002)Noise propagation and failure criteria for VLSI designsProceedings of the 2002 IEEE/ACM international conference on Computer-aided design10.1145/774572.774659(587-594)Online publication date: 10-Nov-2002
  • Show More Cited By

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