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Article

On identifying don't care inputs of test patterns for combinational circuits

Authors:

Seiji Kajihara,

Kohei MiyaseAuthors Info & Claims

ICCAD '01: Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design

Pages 364 - 369

Published: 04 November 2001 Publication History

Abstract

Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don't care (X). In this paper, we propose a method for identifying X inputs of test vectors in a given test set. While there are many combinations of X inputs in the test set generally, the proposed method finds one including X inputs as many as possible, by using fault simulation and procedures similar to implication and justification of ATPG algorithms. Experimental results for ISCAS benchmark circuits show that approximately 66% of inputs of un-compacted test sets could be X in average. Even for compacted test sets, the method found that approximately 47% of inputs are X. Finally, we discuss how logic values are reassigned to the identified X inputs where several applications exist to make test vectors more desirable.

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Cited By

Remersaro SRajski JReddy SPomeranz IBenini LDe Micheli GAl-Hashimi BMueller W(2009)A scalable method for the generation of small test setsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874895(1136-1141)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874895
Chun SKim TKang SKyung CChoi KHa S(2008)A new low energy BIST using a statistical codeProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356960(647-652)Online publication date: 21-Jan-2008
https://dl.acm.org/doi/10.5555/1356802.1356960
Larsson ALarsson EChakrabarty KEles PPeng ZSciuto D(2008)Test-architecture optimization and test scheduling for SOCs with core-level expansion of compressed test patternsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403422(188-193)Online publication date: 10-Mar-2008
https://dl.acm.org/doi/10.1145/1403375.1403422
Show More Cited By

Index Terms

On identifying don't care inputs of test patterns for combinational circuits
1. Hardware

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Information & Contributors

Information

Published In

cover image ACM Conferences

ICCAD '01: Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design

November 2001

656 pages

ISBN:0780372492

Conference Chair:
Rolf Ernst
Tech. Univ. of Braunschweig, Braunschweig, Germany

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
IEEE Circuits & Systems Society
The IEEE Computer Society DATC

Publisher

IEEE Press

Publication History

Published: 04 November 2001

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Article

Conference

ICCAD01

Sponsor:

SIGDA

ICCAD01: International Conference on Computer Aided Design

November 4 - 8, 2001

California, San Jose

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

Remersaro SRajski JReddy SPomeranz IBenini LDe Micheli GAl-Hashimi BMueller W(2009)A scalable method for the generation of small test setsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874895(1136-1141)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874895
Chun SKim TKang SKyung CChoi KHa S(2008)A new low energy BIST using a statistical codeProceedings of the 2008 Asia and South Pacific Design Automation Conference10.5555/1356802.1356960(647-652)Online publication date: 21-Jan-2008
https://dl.acm.org/doi/10.5555/1356802.1356960
Larsson ALarsson EChakrabarty KEles PPeng ZSciuto D(2008)Test-architecture optimization and test scheduling for SOCs with core-level expansion of compressed test patternsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403422(188-193)Online publication date: 10-Mar-2008
https://dl.acm.org/doi/10.1145/1403375.1403422
Larsson ALarsson EEles PPeng ZLauwereins RMadsen J(2007)Optimized integration of test compression and sharing for SOC testingProceedings of the conference on Design, automation and test in Europe10.5555/1266366.1266411(207-212)Online publication date: 16-Apr-2007
https://dl.acm.org/doi/10.5555/1266366.1266411
Doi YKajihara SWen XLi LChakrabarty KTang T(2005)Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxationProceedings of the 2005 Asia and South Pacific Design Automation Conference10.1145/1120725.1120744(59-64)Online publication date: 18-Jan-2005
https://dl.acm.org/doi/10.1145/1120725.1120744
Polian ICzutro ABecker B(2005)Evolutionary Optimization in Code-Based Test CompressionProceedings of the conference on Design, Automation and Test in Europe - Volume 210.1109/DATE.2005.144(1124-1129)Online publication date: 7-Mar-2005
https://dl.acm.org/doi/10.1109/DATE.2005.144
Hayashi TYoshioka HShinogi TKita HTakase HImai M(2004)Test data compression technique using selective don't-care identificationProceedings of the 2004 Asia and South Pacific Design Automation Conference10.5555/1015090.1015144(230-233)Online publication date: 27-Jan-2004
https://dl.acm.org/doi/10.5555/1015090.1015144
Knieser MWolff FPapachristou CWeyer DMcIntyre D(2003)A Technique for High Ratio LZW CompressionProceedings of the conference on Design, Automation and Test in Europe - Volume 110.5555/789083.1022714Online publication date: 3-Mar-2003
https://dl.acm.org/doi/10.5555/789083.1022714
Li LChakrabarty KTouba N(2003)Test data compression using dictionaries with selective entries and fixed-length indicesACM Transactions on Design Automation of Electronic Systems10.1145/944027.9440328:4(470-490)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1145/944027.944032
Reddy SMiyase KKajihara SPomeranz I(2003)On test data volume reduction for multiple scan chain designsACM Transactions on Design Automation of Electronic Systems10.1145/944027.9440318:4(460-469)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1145/944027.944031
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