research-article

Formal verification of tunnel diode oscillator with temperature variations

Authors:

Kusum Lata,

H. S. JamadagniAuthors Info & Claims

ASPDAC '10: Proceedings of the 2010 Asia and South Pacific Design Automation Conference

Pages 217 - 222

Published: 18 January 2010 Publication History

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Abstract

In this paper, we propose an extension to the formal verification approach of hybrid systems to verify the Tunnel Diode Oscillator (TDO) with temperature variations. This enables the same platform that is used for validating the hybrid system, to be also used to formally verify the Tunnel Diode Oscillator with temperature variations. The proposed approach utilizes the simulation traces from the actual implementation of the analog circuits to carry out the formal analysis and verification. We demonstrate our approach around Checkmate [1] and Tunnel diode Oscillator (TDO) as a case study. Current-Voltage simulations were performed on a tunnel diode and the basic feature of the I-V characteristics were analyzed in the temperature range 100--300K. TDO is designed and validated based on these characteristics. In particular, TDO has been verified formally for the continuous range of initial conditions at this temperature range.

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Lahiouel OAridhi HZaki MTahar SCavallaro JZhang TJones ALi H(2014)A semi-formal approach for analog circuits behavioral properties verificationProceedings of the 24th edition of the great lakes symposium on VLSI10.1145/2591513.2591578(247-248)Online publication date: 20-May-2014
https://dl.acm.org/doi/10.1145/2591513.2591578

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Published In

ASPDAC '10: Proceedings of the 2010 Asia and South Pacific Design Automation Conference

January 2010

920 pages

ISBN:9781605588377

General Chair:
Youn-Long Lin
National Tsing Hua University

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IEEE Press

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Published: 18 January 2010

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ASPDAC '10

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TICD
SIGDA

ASPDAC '10: Asia and South Pacific Design Automation Conference

January 18 - 21, 2010

Taipei, Taiwan

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Overall Acceptance Rate 466 of 1,454 submissions, 32%

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Lahiouel OAridhi HZaki MTahar SCavallaro JZhang TJones ALi H(2014)A semi-formal approach for analog circuits behavioral properties verificationProceedings of the 24th edition of the great lakes symposium on VLSI10.1145/2591513.2591578(247-248)Online publication date: 20-May-2014
https://dl.acm.org/doi/10.1145/2591513.2591578

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Features of a tunnel diode oscillator at different temperatures

Impact of Temperature Variations on the Device and Circuit Performance of Tunnel FET: A Simulation Study

A Temperature Compensated CMOS Ring Oscillator for Wireless Sensing Applications

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